Inventor · disambiguated record
Delrae H. Gardner
Also filed as: GARDNER DELRAE · GARDNER DELRAE H
7 granted patents·7 pending applications·166 citations·filing 1998–2010
87Inventor score
Files withCYBEROPTICS SEMICONDUCTOR INC6RAMSEY CRAIG C3GARDNER DELRAE H2BONCIOLINI DENNIS J1CYTEROPTICS SEMICONDUCTOR INC1
Top patents by PatentIndex Score
14 records- 0194US7283255B2Wireless substrate-like sensorCYBEROPTICS SEMICONDUCTOR INC·Filed 2006·Granted Oct 16, 2007·40 cites·20 claims
- 0290US7456977B2Wireless substrate-like sensorCYBEROPTICS SEMICONDUCTOR INC·Filed 2006·Granted Nov 25, 2008·19 cites·20 claims
- 0382US7289230B2Wireless substrate-like sensorCYBEROPTICS SEMICONDUCTOR INC·Filed 2003·Granted Oct 30, 2007·25 cites·17 claims
- 0479US8823933B2Substrate-like particle sensorBONCIOLINI DENNIS J·Filed 2007·Granted Sep 2, 2014·12 cites·10 claims
- 0575US6327275B1Remultiplexing variable rate bitstreams using a delay buffer and rate estimationGEN INSTRUMENT CORP·Filed 1998·Granted Dec 4, 2001·57 cites·20 claims
- 0671US7804306B2Capacitive distance sensing in semiconductor processing toolsCYTEROPTICS SEMICONDUCTOR INC·Filed 2007·Granted Sep 28, 2010·10 cites·14 claims
- 0768US7893697B2Capacitive distance sensing in semiconductor processing toolsCYBEROPTICS SEMICONDUCTOR INC·Filed 2008·Granted Feb 22, 2011·3 cites·11 claims
- 0844US2008246493A1Semiconductor Processing System With Integrated Showerhead Distance Measuring DeviceGARDNER DELRAE H·Filed 2008·Application pending·0 cites
- 0939US2009015268A1Device and method for compensating a capacitive sensor measurement for variations caused by environmental conditions in a semiconductor processing environmentGARDNER DELRAE H·Filed 2008·Application pending·0 cites
- 1038US2005224902A1Wireless substrate-like sensorRAMSEY CRAIG C·Filed 2005·Application pending·0 cites
- 1138US2005224899A1Wireless substrate-like sensorRAMSEY CRAIG C·Filed 2005·Application pending·0 cites
- 1238US2005233770A1Wireless substrate-like sensorRAMSEY CRAIG C·Filed 2005·Application pending·0 cites
- 1336US2010201984A1In-line high pressure particle sensing systemCYBEROPTICS SEMICONDUCTOR INC·Filed 2010·Application pending·0 cites
- 1435US2005086024A1Semiconductor wafer location sensing via non contact methodsCYBEROPTICS SEMICONDUCTOR INC·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →