Inventor
CHEN GEORGE Q
US17 patents
⚠️ This page may combine multiple inventors who share the name “CHEN GEORGE Q”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
6 patentsUS11503266B2Nov 15, 2022
Super-resolution depth map generation for multi-camera or other environments
SAMSUNG ELECTRONICS CO LTD2 citations72
US11195259B2Dec 7, 2021
Apparatus and method for dynamic multi-camera rectification using depth camera
SAMSUNG ELECTRONICS CO LTD3 citations72
US11094041B2Aug 17, 2021
Generation of bokeh images using adaptive focus range and layered scattering
SAMSUNG ELECTRONICS CO LTD2 citations72
US11132772B2Sep 28, 2021
Asymmetric normalized correlation layer for deep neural network feature matching
SAMSUNG ELECTRONICS CO LTD2 citations71
US11532091B2Dec 20, 2022
Guided backpropagation-gradient updating for image processing task using redundant information from image
SAMSUNG ELECTRONICS CO LTD0 citations61
US9892552B2Feb 13, 2018
Method and apparatus for creating 3-dimensional model using volumetric closest point approach
SAMSUNG ELECTRONICS CO LTD1 citations42
ST MICROELECTRONICS INC
5 patentsUS7425984B2Sep 16, 2008
Compound camera and methods for implementing auto-focus, depth-of-field and high-resolution functions
ST MICROELECTRONICS INC146 citations97
US7444013B2Oct 28, 2008
Method and apparatus for recovering depth using multi-plane stereo and spatial propagation
ST MICROELECTRONICS INC42 citations92
US6834119B2Dec 21, 2004
Methods and apparatus for matching multiple images
ST MICROELECTRONICS INC24 citations92
US7054491B2May 30, 2006
Scalable architecture for corresponding multiple video streams at frame rate
ST MICROELECTRONICS INC20 citations78
US7268804B2Sep 11, 2007
Compound camera and method for synthesizing a virtual image from multiple input images
ST MICROELECTRONICS INC2 citations61
KLA TENCOR TECH CORP
5 patentsUS7126681B1Oct 24, 2006
Closed region defect detection system
KLA TENCOR TECH CORP43 citations95
US7046352B1May 16, 2006
Surface inspection system and method using summed light analysis of an inspection surface
KLA TENCOR TECH CORP16 citations82
US7027635B1Apr 11, 2006
Multiple design database layer inspection
KLA TENCOR TECH CORP11 citations81
US7167185B1Jan 23, 2007
Visualization of photomask databases
KLA TENCOR TECH CORP9 citations73
US7499156B2Mar 3, 2009
Closed region defect detection system
KLA TENCOR TECH CORP4 citations62