Inventor

HAIDER MAXIMILIAN

DE9 patents

⚠️ This page may combine multiple inventors who share the name “HAIDER MAXIMILIAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZEISS CARL MICROSCOPY GMBH

3 patents

US9224576B2Dec 29, 2015

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

ZEISS CARL MICROSCOPY GMBH18 citations92

US10504681B2Dec 10, 2019

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

ZEISS CARL MICROSCOPY GMBH3 citations84

US9673024B2Jun 6, 2017

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

ZEISS CARL MICROSCOPY GMBH9 citations84

(unassigned)

2 patents

US6646267B1Nov 11, 2003

Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems

24 citations91

US6605810B1Aug 12, 2003

Device for correcting third-order spherical aberration in a lens, especially the objective lens of an electronic microscope

42 citations91

CARL ZEISS SMT A G

1 patent

US7554094B2Jun 30, 2009

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

CARL ZEISS SMT A G29 citations94

CEOS GMBH

1 patent

US6770878B2Aug 3, 2004

Electron/ion gun for electron or ion beams with high monochromasy or high current density

CEOS GMBH44 citations92

KNIPPELMEYER RAINER

1 patent

US8097847B2Jan 17, 2012

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

KNIPPELMEYER RAINER16 citations91

INTEGRATED CIRCUIT TESTING

1 patent

US5021670AJun 4, 1991

Multipole element

INTEGRATED CIRCUIT TESTING12 citations66