P

Inventor

PUTMAN JOHN B

US95 patents
⚠️ This page may combine multiple inventors who share the name “PUTMAN JOHN B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NANOTRONICS IMAGING INC

43 patents
US11156991B2Oct 26, 2021

Predictive process control for a manufacturing process

NANOTRONICS IMAGING INC12 citations94
US11156992B2Oct 26, 2021

Predictive process control for a manufacturing process

NANOTRONICS IMAGING INC15 citations94
US10247910B1Apr 2, 2019

Systems, devices and methods for automatic microscopic focus

NANOTRONICS IMAGING INC18 citations93
US10146041B1Dec 4, 2018

Systems, devices and methods for automatic microscope focus

NANOTRONICS IMAGING INC23 citations93
US10048477B1Aug 14, 2018

Camera and specimen alignment to facilitate large area imaging in microscopy

NANOTRONICS IMAGING INC30 citations93
US10169852B1Jan 1, 2019

Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging

NANOTRONICS IMAGING INC29 citations92
US11086988B1Aug 10, 2021

Method, systems and apparatus for intelligently emulating factory control systems and simulating response data

NANOTRONICS IMAGING INC8 citations83
US10970831B2Apr 6, 2021

Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging

NANOTRONICS IMAGING INC4 citations83
US10578850B1Mar 3, 2020

Fluorescence microscopy inspection systems, apparatus and methods

NANOTRONICS IMAGING INC9 citations83
US10467740B1Nov 5, 2019

Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging

NANOTRONICS IMAGING INC4 citations83
US11117328B2Sep 14, 2021

Systems, methods, and media for manufacturing processes

NANOTRONICS IMAGING INC15 citations82
US10545096B1Jan 28, 2020

Marco inspection systems, apparatus and methods

NANOTRONICS IMAGING INC7 citations82
US10481379B1Nov 19, 2019

Method and system for automatically mapping fluid objects on a substrate

NANOTRONICS IMAGING INC9 citations82
US10254214B1Apr 9, 2019

Systems, devices, and methods for combined wafer and photomask inspection

NANOTRONICS IMAGING INC6 citations78
US12298489B2May 13, 2025

Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel

NANOTRONICS IMAGING INC1 citations74
US12153411B2Nov 26, 2024

Predictive process control for a manufacturing process

NANOTRONICS IMAGING INC2 citations73
US12111923B2Oct 8, 2024

Dynamic monitoring and securing of factory processes, equipment and automated systems

NANOTRONICS IMAGING INC1 citations73
US11411293B1Aug 9, 2022

Fault protected signal splitter apparatus

NANOTRONICS IMAGING INC2 citations73
US11100221B2Aug 24, 2021

Dynamic monitoring and securing of factory processes, equipment and automated systems

NANOTRONICS IMAGING INC2 citations73
US11063965B1Jul 13, 2021

Dynamic monitoring and securing of factory processes, equipment and automated systems

NANOTRONICS IMAGING INC3 citations73
US11662563B2May 30, 2023

Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel

NANOTRONICS IMAGING INC2 citations72
US11656429B2May 23, 2023

Systems, devices, and methods for automatic microscopic focus

NANOTRONICS IMAGING INC1 citations72
US11294162B2Apr 5, 2022

Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel

NANOTRONICS IMAGING INC2 citations72
US10698191B2Jun 30, 2020

Camera and specimen alignment to facilitate large area imaging in microscopy

NANOTRONICS IMAGING INC1 citations72
US10509199B2Dec 17, 2019

Systems, devices and methods for automatic microscopic focus

NANOTRONICS IMAGING INC2 citations72
US10416426B2Sep 17, 2019

Camera and specimen alignment to facilitate large area imaging in microscopy

NANOTRONICS IMAGING INC1 citations72
US11815673B2Nov 14, 2023

Method and system for mapping objects on unknown specimens

NANOTRONICS IMAGING INC2 citations71
US10915992B1Feb 9, 2021

System, method and apparatus for macroscopic inspection of reflective specimens

NANOTRONICS IMAGING INC3 citations71
US11727672B1Aug 15, 2023

System and method for generating training data sets for specimen defect detection

NANOTRONICS IMAGING INC2 citations70
US11561383B2Jan 24, 2023

Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto

NANOTRONICS IMAGING INC2 citations70
US11947671B2Apr 2, 2024

Method, systems and apparatus for intelligently emulating factory control systems and simulating response data

NANOTRONICS IMAGING INC0 citations63
US11669617B2Jun 6, 2023

Method, systems and apparatus for intelligently emulating factory control systems and simulating response data

NANOTRONICS IMAGING INC0 citations63
US12449792B2Oct 21, 2025

Predictive process control for a manufacturing process

NANOTRONICS IMAGING INC0 citations62
US12155673B2Nov 26, 2024

Dynamic monitoring and securing of factory processes, equipment and automated systems

NANOTRONICS IMAGING INC0 citations62
US12153412B2Nov 26, 2024

Predictive process control for a manufacturing process

NANOTRONICS IMAGING INC0 citations62
US12111922B2Oct 8, 2024

Method, systems and apparatus for intelligently emulating factory control systems and simulating response data

NANOTRONICS IMAGING INC0 citations62
US11961210B2Apr 16, 2024

System, method and apparatus for macroscopic inspection of reflective specimens

NANOTRONICS IMAGING INC0 citations62
US11955686B2Apr 9, 2024

Fault protected signal splitter apparatus

NANOTRONICS IMAGING INC0 citations62
US11953863B2Apr 9, 2024

Dynamic monitoring and securing of factory processes, equipment and automated systems

NANOTRONICS IMAGING INC0 citations62
US11894596B2Feb 6, 2024

Fault protected signal splitter apparatus

NANOTRONICS IMAGING INC0 citations62
US11880028B2Jan 23, 2024

Apparatus and method to reduce vignetting in microscopic imaging

NANOTRONICS IMAGING INC0 citations62
US11784386B2Oct 10, 2023

Fault protected signal splitter apparatus

NANOTRONICS IMAGING INC0 citations62
US11709483B2Jul 25, 2023

Predictive process control for a manufacturing process

NANOTRONICS IMAGING INC0 citations62

TECH PRO INC

2 patents

PUTMAN MATTHEW C

2 patents

(unassigned)

1 patent

NANOTRONICS HEALTH LLC

1 patent

PUTMAN JOHN B

1 patent

Showing the top 50 of 95 patents by PatentIndex Score.