Inventor
PUTMAN JOHN B
US95 patents
⚠️ This page may combine multiple inventors who share the name “PUTMAN JOHN B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NANOTRONICS IMAGING INC
43 patentsUS11156991B2Oct 26, 2021
Predictive process control for a manufacturing process
NANOTRONICS IMAGING INC12 citations94
US11156992B2Oct 26, 2021
Predictive process control for a manufacturing process
NANOTRONICS IMAGING INC15 citations94
US10247910B1Apr 2, 2019
Systems, devices and methods for automatic microscopic focus
NANOTRONICS IMAGING INC18 citations93
US10146041B1Dec 4, 2018
Systems, devices and methods for automatic microscope focus
NANOTRONICS IMAGING INC23 citations93
US10048477B1Aug 14, 2018
Camera and specimen alignment to facilitate large area imaging in microscopy
NANOTRONICS IMAGING INC30 citations93
US10169852B1Jan 1, 2019
Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
NANOTRONICS IMAGING INC29 citations92
US11086988B1Aug 10, 2021
Method, systems and apparatus for intelligently emulating factory control systems and simulating response data
NANOTRONICS IMAGING INC8 citations83
US10970831B2Apr 6, 2021
Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
NANOTRONICS IMAGING INC4 citations83
US10578850B1Mar 3, 2020
Fluorescence microscopy inspection systems, apparatus and methods
NANOTRONICS IMAGING INC9 citations83
US10467740B1Nov 5, 2019
Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
NANOTRONICS IMAGING INC4 citations83
US11117328B2Sep 14, 2021
Systems, methods, and media for manufacturing processes
NANOTRONICS IMAGING INC15 citations82
US10545096B1Jan 28, 2020
Marco inspection systems, apparatus and methods
NANOTRONICS IMAGING INC7 citations82
US10481379B1Nov 19, 2019
Method and system for automatically mapping fluid objects on a substrate
NANOTRONICS IMAGING INC9 citations82
US10254214B1Apr 9, 2019
Systems, devices, and methods for combined wafer and photomask inspection
NANOTRONICS IMAGING INC6 citations78
US12298489B2May 13, 2025
Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel
NANOTRONICS IMAGING INC1 citations74
US12153411B2Nov 26, 2024
Predictive process control for a manufacturing process
NANOTRONICS IMAGING INC2 citations73
US12111923B2Oct 8, 2024
Dynamic monitoring and securing of factory processes, equipment and automated systems
NANOTRONICS IMAGING INC1 citations73
US11411293B1Aug 9, 2022
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC2 citations73
US11100221B2Aug 24, 2021
Dynamic monitoring and securing of factory processes, equipment and automated systems
NANOTRONICS IMAGING INC2 citations73
US11063965B1Jul 13, 2021
Dynamic monitoring and securing of factory processes, equipment and automated systems
NANOTRONICS IMAGING INC3 citations73
US11662563B2May 30, 2023
Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel
NANOTRONICS IMAGING INC2 citations72
US11656429B2May 23, 2023
Systems, devices, and methods for automatic microscopic focus
NANOTRONICS IMAGING INC1 citations72
US11294162B2Apr 5, 2022
Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel
NANOTRONICS IMAGING INC2 citations72
US10698191B2Jun 30, 2020
Camera and specimen alignment to facilitate large area imaging in microscopy
NANOTRONICS IMAGING INC1 citations72
US10509199B2Dec 17, 2019
Systems, devices and methods for automatic microscopic focus
NANOTRONICS IMAGING INC2 citations72
US10416426B2Sep 17, 2019
Camera and specimen alignment to facilitate large area imaging in microscopy
NANOTRONICS IMAGING INC1 citations72
US11815673B2Nov 14, 2023
Method and system for mapping objects on unknown specimens
NANOTRONICS IMAGING INC2 citations71
US10915992B1Feb 9, 2021
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC3 citations71
US11727672B1Aug 15, 2023
System and method for generating training data sets for specimen defect detection
NANOTRONICS IMAGING INC2 citations70
US11561383B2Jan 24, 2023
Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto
NANOTRONICS IMAGING INC2 citations70
US11947671B2Apr 2, 2024
Method, systems and apparatus for intelligently emulating factory control systems and simulating response data
NANOTRONICS IMAGING INC0 citations63
US11669617B2Jun 6, 2023
Method, systems and apparatus for intelligently emulating factory control systems and simulating response data
NANOTRONICS IMAGING INC0 citations63
US12449792B2Oct 21, 2025
Predictive process control for a manufacturing process
NANOTRONICS IMAGING INC0 citations62
US12155673B2Nov 26, 2024
Dynamic monitoring and securing of factory processes, equipment and automated systems
NANOTRONICS IMAGING INC0 citations62
US12153412B2Nov 26, 2024
Predictive process control for a manufacturing process
NANOTRONICS IMAGING INC0 citations62
US12111922B2Oct 8, 2024
Method, systems and apparatus for intelligently emulating factory control systems and simulating response data
NANOTRONICS IMAGING INC0 citations62
US11961210B2Apr 16, 2024
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations62
US11955686B2Apr 9, 2024
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations62
US11953863B2Apr 9, 2024
Dynamic monitoring and securing of factory processes, equipment and automated systems
NANOTRONICS IMAGING INC0 citations62
US11894596B2Feb 6, 2024
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations62
US11880028B2Jan 23, 2024
Apparatus and method to reduce vignetting in microscopic imaging
NANOTRONICS IMAGING INC0 citations62
US11784386B2Oct 10, 2023
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations62
US11709483B2Jul 25, 2023
Predictive process control for a manufacturing process
NANOTRONICS IMAGING INC0 citations62
TECH PRO INC
2 patentsPUTMAN MATTHEW C
2 patents(unassigned)
1 patentNANOTRONICS HEALTH LLC
1 patentPUTMAN JOHN B
1 patentShowing the top 50 of 95 patents by PatentIndex Score.