Inventor
MOSKIE MICHAEL
US17 patents
Patents
17 patentsUS10545096B1Jan 28, 2020
Marco inspection systems, apparatus and methods
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US10254214B1Apr 9, 2019
Systems, devices, and methods for combined wafer and photomask inspection
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US11411293B1Aug 9, 2022
Fault protected signal splitter apparatus
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US10915992B1Feb 9, 2021
System, method and apparatus for macroscopic inspection of reflective specimens
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US11961210B2Apr 16, 2024
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations62
US11955686B2Apr 9, 2024
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations62
US11894596B2Feb 6, 2024
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations62
US11784386B2Oct 10, 2023
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations62
US11593919B2Feb 28, 2023
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations62
US11995802B2May 28, 2024
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US11663703B2May 30, 2023
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US11656184B2May 23, 2023
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11408829B2Aug 9, 2022
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11341617B2May 24, 2022
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US10914686B2Feb 9, 2021
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US12368223B2Jul 22, 2025
Fault protected signal splitter apparatus
NANOTRONICS IMAGING INC0 citations60
US11125677B2Sep 21, 2021
Systems, devices, and methods for combined wafer and photomask inspection
NANOTRONICS IMAGING INC1 citations56