Inventor
STEJSKAL PAVEL
CZ11 patents
⚠️ This page may combine multiple inventors who share the name “STEJSKAL PAVEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FEI CO
8 patentsUS9618463B2Apr 11, 2017
Method of acquiring EBSP patterns
FEI CO9 citations79
US10978272B2Apr 13, 2021
Measurement and endpointing of sample thickness
FEI CO5 citations70
US10937627B2Mar 2, 2021
Multi-beam electron microscope
FEI CO2 citations70
US11114275B2Sep 7, 2021
Methods and systems for acquiring electron backscatter diffraction patterns
FEI CO5 citations63
US11195693B1Dec 7, 2021
Method and system for dynamic band contrast imaging
FEI CO0 citations60
US12580150B2Mar 17, 2026
Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors
FEI CO0 citations53
US11676795B2Jun 13, 2023
Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets
FEI CO0 citations46
US9958403B1May 1, 2018
Arrangement for X-Ray tomography
FEI CO0 citations38