Inventor
LEU REN-JYH
TW4 patents
⚠️ This page may combine multiple inventors who share the name “LEU REN-JYH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
3 patentsUS6252670B1Jun 26, 2001
Method for accurately calibrating a constant-angle reflection-interference spectrometer (CARIS) for measuring photoresist thickness
TAIWAN SEMICONDUCTOR MFG18 citations79
US6531374B2Mar 11, 2003
Overlay shift correction for the deposition of epitaxial silicon layer and post-epitaxial silicon layers in a semiconductor device
TAIWAN SEMICONDUCTOR MFG8 citations70
US6652912B2Nov 25, 2003
Method and system for spraying a viscous material on a wafer
TAIWAN SEMICONDUCTOR MFG0 citations49