Inventor
DENG YUCHEN
NL14 patents
Patents
14 patentsUS11183364B1Nov 23, 2021
Dual beam microscope system for imaging during sample processing
FEI CO7 citations82
US11906450B2Feb 20, 2024
Electron diffraction holography
FEI CO2 citations71
US11460419B2Oct 4, 2022
Electron diffraction holography
FEI CO4 citations71
US10937625B2Mar 2, 2021
Method of imaging a sample using an electron microscope
FEI CO4 citations70
US10923308B1Feb 16, 2021
Method and system for energy resolved chroma imaging
FEI CO2 citations69
US11456149B2Sep 27, 2022
Methods and systems for acquiring 3D diffraction data
FEI CO0 citations62
US12216068B2Feb 4, 2025
Bifocal electron microscope
FEI CO0 citations61
US11404241B2Aug 2, 2022
Simultaneous TEM and STEM microscope
FEI CO0 citations61
US12327342B2Jun 10, 2025
Automatic particle beam focusing
FEI CO0 citations56
US11887809B2Jan 30, 2024
Auto-tuning stage settling time with feedback in charged particle microscopy
FEI CO0 citations56
US11715618B2Aug 1, 2023
System and method for reducing the charging effect in a transmission electron microscope system
FEI CO0 citations56
US11799486B2Oct 24, 2023
Systems and methods for quantum computing based sample analysis
FEI CO0 citations55
US11501197B2Nov 15, 2022
Systems and methods for quantum computing based sample analysis
FEI CO0 citations55
US12347083B2Jul 1, 2025
Area selection in charged particle microscope imaging
FEI CO0 citations50