Inventor
KRISHNAMOORTHY NIKILA
IN11 patents
⚠️ This page may combine multiple inventors who share the name “KRISHNAMOORTHY NIKILA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
5 patentsUS7134061B2Nov 7, 2006
At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform
TEXAS INSTRUMENTS INC69 citations95
US6925408B2Aug 2, 2005
Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components
TEXAS INSTRUMENTS INC19 citations79
US7421634B2Sep 2, 2008
Sequential scan based techniques to test interface between modules designed to operate at different frequencies
TEXAS INSTRUMENTS INC4 citations59
US7120842B2Oct 10, 2006
Mechanism to enhance observability of integrated circuit failures during burn-in tests
TEXAS INSTRUMENTS INC2 citations54
US7213184B2May 1, 2007
Testing of modules operating with different characteristics of control signals using scan based techniques
TEXAS INSTRUMENTS INC0 citations40
NXP BV
4 patentsUS10955473B1Mar 23, 2021
System and method of scan reset upon entering scan mode
NXP BV5 citations72
US11686769B1Jun 27, 2023
Signal toggling detection and correction circuit
NXP BV1 citations57
US12196804B2Jan 14, 2025
System for scan mode exit and methods for scan mode exit
NXP BV0 citations41
US11879939B2Jan 23, 2024
System and method for testing clocking systems in integrated circuits
NXP BV0 citations41