Inventor
WANG SHIH-CHANG
TW31 patents
⚠️ This page may combine multiple inventors who share the name “WANG SHIH-CHANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LEOTEK ELECTRONICS CORP
8 patentsUS7347706B1Mar 25, 2008
Light emitting diode (LED) based street light and other lighting applications
LEOTEK ELECTRONICS CORP98 citations97
US6911915B2Jun 28, 2005
Compact light emitting diode retrofit lamp and method for traffic signal lights
LEOTEK ELECTRONICS CORP69 citations93
US9052073B2Jun 9, 2015
Assembly structure of light-guiding cover and lighting device using the same
LEOTEK ELECTRONICS CORP4 citations71
US8833978B2Sep 16, 2014
Traffic signal light device
LEOTEK ELECTRONICS CORP6 citations70
US9086199B2Jul 21, 2015
Lighting device installation method and lighting system
LEOTEK ELECTRONICS CORP1 citations50
US9062865B2Jun 23, 2015
Housing and light emitting device having the same
LEOTEK ELECTRONICS CORP0 citations50
US9341351B2May 17, 2016
Universal mounting system for pole mounted area lights
LEOTEK ELECTRONICS CORP0 citations49
US9702527B2Jul 11, 2017
Light emitting device
LEOTEK ELECTRONICS CORP0 citations35
LITE ON ELECTRONICS GUANGZHOU
4 patentsUS10208907B2Feb 19, 2019
Lighting device and reflective plate therefor for making the lighting device generate a predetermined light type
LITE ON ELECTRONICS GUANGZHOU2 citations69
US11125414B2Sep 21, 2021
Light distribution module
LITE ON ELECTRONICS GUANGZHOU1 citations58
US9982856B2May 29, 2018
Lighting assembly
LITE ON ELECTRONICS GUANGZHOU0 citations50
US10314136B2Jun 4, 2019
Traffic light driving control circuit
LITE ON ELECTRONICS GUANGZHOU0 citations38
TAIWAN SEMICONDUCTOR MFG CO LTD
4 patentsUS12387318B2Aug 12, 2025
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12068207B2Aug 20, 2024
Simultaneous multi-bandwidth optical inspection of semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations58
US11900586B2Feb 13, 2024
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US10872406B2Dec 22, 2020
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
TU CHIN-WANG
3 patentsLITE ON TECHNOLOGY CORP
3 patentsUS9816686B2Nov 14, 2017
Lens with reduced thickness and optical unit having the same
LITE ON TECHNOLOGY CORP0 citations48
US10008137B2Jun 26, 2018
Illuminated sign with compartmented portion
LITE ON TECHNOLOGY CORP0 citations39
US9769904B2Sep 19, 2017
Light-emitting device
LITE ON TECHNOLOGY CORP0 citations35