P

Inventor

HU XUERANG

US51 patents
⚠️ This page may combine multiple inventors who share the name “HU XUERANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

44 patents
US10879031B2Dec 29, 2020

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV30 citations98
US10395886B2Aug 27, 2019

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV16 citations94
US10541110B2Jan 21, 2020

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV5 citations84
US11804356B2Oct 31, 2023

Apparatus using multiple beams of charged particles

ASML NETHERLANDS BV2 citations73
US11705304B2Jul 18, 2023

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV2 citations73
US11594396B2Feb 28, 2023

Multi-beam inspection apparatus with single-beam mode

ASML NETHERLANDS BV2 citations73
US11469074B2Oct 11, 2022

Multiple charged-particle beam apparatus with low crosstalk

ASML NETHERLANDS BV3 citations73
US11398368B2Jul 26, 2022

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV1 citations73
US11289304B2Mar 29, 2022

Apparatus using multiple beams of charged particles

ASML NETHERLANDS BV3 citations73
US11282675B2Mar 22, 2022

Multi-beam inspection apparatus with improved detection performance of signal electrons

ASML NETHERLANDS BV2 citations73
US11232928B2Jan 25, 2022

Multi-beam inspection apparatus

ASML NETHERLANDS BV2 citations73
US11222766B2Jan 11, 2022

Multi-cell detector for charged particles

ASML NETHERLANDS BV4 citations73
US11062877B2Jul 13, 2021

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV1 citations73
US10892138B2Jan 12, 2021

Multi-beam inspection apparatus with improved detection performance of signal electrons

ASML NETHERLANDS BV3 citations73
US10811222B2Oct 20, 2020

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV1 citations73
US12211669B2Jan 28, 2025

Multiple charged-particle beam apparatus with low crosstalk

ASML NETHERLANDS BV3 citations71
US12243709B2Mar 4, 2025

Apparatus using multiple charged particle beams

ASML NETHERLANDS BV0 citations63
US12237143B2Feb 25, 2025

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV0 citations63
US12237144B2Feb 25, 2025

Apparatus using multiple beams of charged particles

ASML NETHERLANDS BV0 citations63
US12142453B2Nov 12, 2024

Multi-beam inspection apparatus

ASML NETHERLANDS BV0 citations63
US11961697B2Apr 16, 2024

Apparatus using charged particle beams

ASML NETHERLANDS BV0 citations63
US11887807B2Jan 30, 2024

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV0 citations63
USRE49784EJan 2, 2024

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV0 citations63
US11721521B2Aug 8, 2023

Multi-beam inspection apparatus with improved detection performance of signal electrons

ASML NETHERLANDS BV0 citations63
US11676793B2Jun 13, 2023

Apparatus of plural charged particle beams

ASML NETHERLANDS BV1 citations63
US11670477B2Jun 6, 2023

Apparatus using charged particle beams

ASML NETHERLANDS BV0 citations63
US11587758B2Feb 21, 2023

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV0 citations63
US11538655B2Dec 27, 2022

Multi-beam inspection apparatus

ASML NETHERLANDS BV0 citations63
US11062874B2Jul 13, 2021

Apparatus using multiple charged particle beams

ASML NETHERLANDS BV0 citations63
US12424408B2Sep 23, 2025

Apparatus of plural charged-particle beams

ASML NETHERLANDS BV0 citations62
US12191109B2Jan 7, 2025

Sample pre-charging methods and apparatuses for charged particle beam inspection

ASML NETHERLANDS BV0 citations62
US12033830B2Jul 9, 2024

Multiple charged-particle beam apparatus with low crosstalk

ASML NETHERLANDS BV1 citations62
US11784024B2Oct 10, 2023

Multi-cell detector for charged particles

ASML NETHERLANDS BV0 citations62
US11676792B2Jun 13, 2023

Sample pre-charging methods and apparatuses for charged particle beam inspection

ASML NETHERLANDS BV0 citations62
US12469668B2Nov 11, 2025

Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus

ASML NETHERLANDS BV0 citations61
US12463010B2Nov 4, 2025

Multiple charged-particle beam apparatus and methods

ASML NETHERLANDS BV0 citations60
US11854765B2Dec 26, 2023

Multiple charged-particle beam apparatus and methods

ASML NETHERLANDS BV0 citations60
US12080515B2Sep 3, 2024

Apparatus for multiple charged-particle beams

ASML NETHERLANDS BV0 citations59
US11302514B2Apr 12, 2022

Apparatus for multiple charged-particle beams

ASML NETHERLANDS BV1 citations59
US12347643B2Jul 1, 2025

Multiple charged-particle beam apparatus and methods of operating the same using movable lenses

ASML NETHERLANDS BV0 citations52
US12278081B2Apr 15, 2025

System and method for alignment of secondary beams in multi-beam inspection apparatus

ASML NETHERLANDS BV0 citations52
US10879032B2Dec 29, 2020

Multi-beam inspection apparatus

ASML NETHERLANDS BV0 citations52
US11614416B2Mar 28, 2023

System and method for aligning electron beams in multi-beam inspection apparatus

ASML NETHERLANDS BV0 citations50
US11961698B2Apr 16, 2024

Replaceable module for a charged particle apparatus

ASML NETHERLANDS BV0 citations44

HERMES MICROVISION INC

5 patents

HERMES-MICROVISION INC

1 patent

Showing the top 50 of 51 patents by PatentIndex Score.