Inventor

NIJS FRANS

BE2 patents

⚠️ This page may combine multiple inventors who share the name “NIJS FRANS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MAISON BENOIT

1 patent

US9140546B2Sep 22, 2015

Apparatus and method for three dimensional inspection of wafer saw marks

MAISON BENOIT2 citations55

KLA TENCOR CORP

1 patent

US10215560B2Feb 26, 2019

Method for shape classification of an object

KLA TENCOR CORP0 citations28