Inventor

WONG KOK WENG

SG5 patents

⚠️ This page may combine multiple inventors who share the name “WONG KOK WENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MIT SEMICONDUCTOR PTE LTD

2 patents

US11825211B2Nov 21, 2023

Method of color inspection by using monochrome imaging with multiple wavelengths of light

MIT SEMICONDUCTOR PTE LTD0 citations37

US11953312B2Apr 9, 2024

System and method of object inspection using multispectral 3D laser scanning

MIT SEMICONDUCTOR PTE LTD0 citations33

SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD

1 patent

US10876975B2Dec 29, 2020

System and method for inspecting a wafer

SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD4 citations69

AMANULLAH AJHARALI

1 patent

US10161881B2Dec 25, 2018

System and method for inspecting a wafer

AMANULLAH AJHARALI1 citations46

Generic Power Ptd Ltd

1 patent

US10151580B2Dec 11, 2018

Methods of inspecting a 3D object using 2D image processing

Generic Power Ptd Ltd1 citations38