Inventor
WEN SI
US2 patents
Patents
2 patentsUS12272059B2Apr 8, 2025
System and method associated with predicting segmentation quality of objects in analysis of copious image data
UNIV NEW YORK STATE RES FOUND0 citations54
US11748877B2Sep 5, 2023
System and method associated with predicting segmentation quality of objects in analysis of copious image data
UNIV NEW YORK STATE RES FOUND1 citations54