Inventor
NAGATSUMA TADAO
JP42 patents
⚠️ This page may combine multiple inventors who share the name “NAGATSUMA TADAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ANDO ELECTRIC
29 patentsUS6166845ADec 26, 2000
Electro-optic probe
ANDO ELECTRIC22 citations92
US6567760B1May 20, 2003
Electro-optic sampling oscilloscope
ANDO ELECTRIC17 citations83
US6445198B1Sep 3, 2002
Electro-optic sampling probe and a method for adjusting the same
ANDO ELECTRIC7 citations73
US6429669B1Aug 6, 2002
Temperature-insensitive electro-optic probe
ANDO ELECTRIC10 citations73
US6384590B1May 7, 2002
Light receiving circuit for use in electro-optic sampling oscilloscope
ANDO ELECTRIC13 citations73
US6297651B1Oct 2, 2001
Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module
ANDO ELECTRIC8 citations73
US6232765B1May 15, 2001
Electro-optical oscilloscope with improved sampling
ANDO ELECTRIC8 citations73
US6201235B1Mar 13, 2001
Electro-optic sampling oscilloscope
ANDO ELECTRIC14 citations73
US6310507B1Oct 30, 2001
Timing generation circuit for electro-optic sampling oscilloscope
ANDO ELECTRIC7 citations72
US6624644B2Sep 23, 2003
Electro-optic probe and magneto-optic probe
ANDO ELECTRIC2 citations62
US6507014B2Jan 14, 2003
Electro-optic probe
ANDO ELECTRIC3 citations62
US6469528B2Oct 22, 2002
Electro-optic sampling probe and measuring method using the same
ANDO ELECTRIC5 citations62
US6410906B1Jun 25, 2002
Electro-optic probe
ANDO ELECTRIC5 citations62
US6407561B1Jun 18, 2002
Probe for electro-optic sampling oscilloscope
ANDO ELECTRIC2 citations62
US6388454B1May 14, 2002
Electro-optic sampling prober
ANDO ELECTRIC4 citations62
US6369562B2Apr 9, 2002
Electro-optical probe for oscilloscope measuring signal waveform
ANDO ELECTRIC5 citations62
US6348787B1Feb 19, 2002
Electrooptic probe
ANDO ELECTRIC2 citations62
US6342783B1Jan 29, 2002
Electrooptic probe
ANDO ELECTRIC3 citations62
US6337565B1Jan 8, 2002
Electro-optic probe
ANDO ELECTRIC5 citations62
US6297650B1Oct 2, 2001
Electrooptic probe
ANDO ELECTRIC4 citations62
US6288531B1Sep 11, 2001
Probe for electro-optic sampling oscilloscope
ANDO ELECTRIC3 citations62
US6087838AJul 11, 2000
Signal processing circuit for electro-optic probe
ANDO ELECTRIC2 citations62
US6377036B1Apr 23, 2002
Electro-optic sampling oscilloscope
ANDO ELECTRIC2 citations61
US6347005B1Feb 12, 2002
Electro-optic sampling probe
ANDO ELECTRIC3 citations61
US6452378B1Sep 17, 2002
Probe for electro-optic sampling oscilloscope
ANDO ELECTRIC6 citations60
US6288529B1Sep 11, 2001
Timing generation circuit for an electro-optic oscilloscope
ANDO ELECTRIC4 citations60
US6403946B1Jun 11, 2002
Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system
ANDO ELECTRIC1 citations52
US6252387B1Jun 26, 2001
Oscilloscope utilizing probe with electro-optic crystal
ANDO ELECTRIC1 citations51
US6683447B1Jan 27, 2004
Electro-optic apparatus for measuring signal potentials
ANDO ELECTRIC0 citations40
ROHM CO LTD
5 patentsUS9632247B2Apr 25, 2017
Terahertz-wave device and terahetz-wave integrated circuits
ROHM CO LTD3 citations72
US10276919B2Apr 30, 2019
Terahertz device and terahertz integrated circuit
ROHM CO LTD2 citations71
US9188742B2Nov 17, 2015
Teraherz-wave connector and teraherz-wave integrated circuits, and wave guide and antenna structure
ROHM CO LTD2 citations61
US12165977B2Dec 10, 2024
Terahertz module
ROHM CO LTD0 citations56
US9496622B2Nov 15, 2016
Photonic-crystal slab absorber and high-frequency circuit and electronic components, and transmitter, receiver and proximity wireless communication system
ROHM CO LTD1 citations51
NIPPON TELEGRAPH & TELEPHONE
4 patentsUS5808473ASep 15, 1998
Electric signal measurement apparatus using electro-optic sampling by one point contact
NIPPON TELEGRAPH & TELEPHONE34 citations89
US5274325ADec 28, 1993
Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits
NIPPON TELEGRAPH & TELEPHONE17 citations82
US5543723AAug 6, 1996
Apparatus for electro-optic sampling measuring of electrical signals in integrated circuits with improved probe positioning accuracy
NIPPON TELEGRAPH & TELEPHONE3 citations63
US6468895B2Oct 22, 2002
Pattern forming method
NIPPON TELEGRAPH & TELEPHONE2 citations61
UNIV OSAKA
3 patentsUS10761126B2Sep 1, 2020
Electro-optic probe, electromagnetic wave measuring apparatus, and electromagnetic wave measuring method
UNIV OSAKA2 citations69
US10451663B2Oct 22, 2019
Method for measuring electromagnetic field, electromagnetic field measurement device, and phase imaging device
UNIV OSAKA1 citations58
US12482951B2Nov 25, 2025
Dielectric waveguide, terahertz circuit and terahertz integrated circuit
UNIV OSAKA0 citations53