Inventor
ISOBE YOSHIHIKO
JP26 patents
⚠️ This page may combine multiple inventors who share the name “ISOBE YOSHIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOYO KOHAN CO LTD
8 patentsUS6497978B1Dec 24, 2002
Explosion-proof safety valve assemblage for a secondary battery
TOYO KOHAN CO LTD32 citations92
US6257267B1Jul 10, 2001
Safety valve element for capacitor and capacitor case lid with safety valves
TOYO KOHAN CO LTD19 citations92
US5238481AAug 24, 1993
Heat resistant sintered hard alloy
TOYO KOHAN CO LTD25 citations92
US6150037ANov 21, 2000
Cladding material
TOYO KOHAN CO LTD16 citations84
US6303246B1Oct 16, 2001
Hermetically sealed cell and sealing body
TOYO KOHAN CO LTD16 citations83
US6440599B1Aug 27, 2002
Hermetically sealed cell
TOYO KOHAN CO LTD11 citations73
US6423440B1Jul 23, 2002
Closed battery and closing member
TOYO KOHAN CO LTD10 citations73
US6737187B2May 18, 2004
Closed battery
TOYO KOHAN CO LTD2 citations62
NIPPON DENSO CO
6 patentsUS5747846AMay 5, 1998
Programmable non-volatile memory cell
NIPPON DENSO CO36 citations92
US5625218AApr 29, 1997
Semiconductor device equipped with a heat-fusible thin film resistor and production method thereof
NIPPON DENSO CO28 citations92
US5187559AFeb 16, 1993
Semiconductor device and process for producing same
NIPPON DENSO CO39 citations92
US6066891AMay 23, 2000
Electrode for semiconductor device including an alloy wiring layer for reducing defects in an aluminum layer and method for manufacturing the same
NIPPON DENSO CO21 citations91
US5284794AFeb 8, 1994
Method of making semiconductor device using a trimmable thin-film resistor
NIPPON DENSO CO21 citations90
US6287933B1Sep 11, 2001
Semiconductor device having thin film resistor and method of producing same
NIPPON DENSO CO10 citations69
DENSO CORP
5 patentsUS6198140B1Mar 6, 2001
Semiconductor device including several transistors and method of manufacturing the same
DENSO CORP28 citations92
US6650017B1Nov 18, 2003
Electrical wiring of semiconductor device enabling increase in electromigration (EM) lifetime
DENSO CORP24 citations91
US7644623B2Jan 12, 2010
Semiconductor sensor for measuring a physical quantity and method of manufacturing the same
DENSO CORP7 citations73
US6908857B2Jun 21, 2005
Method of manufacturing semiconductor device
DENSO CORP10 citations72
US6337504B1Jan 8, 2002
Insulated gate transistor with leakage current prevention feature
DENSO CORP9 citations71