Inventor
KWON KEE-WON
KR25 patents
⚠️ This page may combine multiple inventors who share the name “KWON KEE-WON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
22 patentsUS7457181B2Nov 25, 2008
Memory device and method of operating the same
SAMSUNG ELECTRONICS CO LTD413 citations99
US5552337ASep 3, 1996
Method for manfacturing a capacitor for a semiconductor memory device having a tautalum oxide film
SAMSUNG ELECTRONICS CO LTD58 citations96
US5834348ANov 10, 1998
Method for manufacturing a semiconductor device having a ferroelectric capacitor
SAMSUNG ELECTRONICS CO LTD25 citations92
US5796133AAug 18, 1998
Semiconductor device capacitor having lower electrodes separated by low dielectric spacer material
SAMSUNG ELECTRONICS CO LTD33 citations92
US8384439B2Feb 26, 2013
Semiconductor devices and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD10 citations84
US7477563B2Jan 13, 2009
Dynamic random access memory device and associated refresh cycle
SAMSUNG ELECTRONICS CO LTD13 citations84
US7286415B2Oct 23, 2007
Semiconductor memory devices having a dual port mode and methods of operating the same
SAMSUNG ELECTRONICS CO LTD11 citations84
US7199623B2Apr 3, 2007
Method and apparatus for providing a power-on reset signal
SAMSUNG ELECTRONICS CO LTD13 citations84
US6914461B2Jul 5, 2005
Power-on reset circuits including first and second signal generators and related methods
SAMSUNG ELECTRONICS CO LTD17 citations84
US7618186B2Nov 17, 2009
Self-calibrating temperature sensors and methods thereof
SAMSUNG ELECTRONICS CO LTD11 citations82
US7199632B2Apr 3, 2007
Duty cycle correction circuit for use in a semiconductor device
SAMSUNG ELECTRONICS CO LTD15 citations80
US6882561B2Apr 19, 2005
Semiconductor memory device comprising memory having active restoration function
SAMSUNG ELECTRONICS CO LTD8 citations74
US10482962B2Nov 19, 2019
TCAM device and operating method thereof
SAMSUNG ELECTRONICS CO LTD3 citations69
US7259592B2Aug 21, 2007
Output drivers having adjustable swing widths during test mode operation
SAMSUNG ELECTRONICS CO LTD6 citations63
US7145493B2Dec 5, 2006
Digital-to-analog converter (DAC) circuits using different currents for calibration biasing and methods of operating same
SAMSUNG ELECTRONICS CO LTD3 citations63
US6980048B2Dec 27, 2005
Voltage generating circuit capable of supplying stable output voltage regardless of external input voltage
SAMSUNG ELECTRONICS CO LTD4 citations63
US6879527B2Apr 12, 2005
Semiconductor memory device with structure providing increased operating speed
SAMSUNG ELECTRONICS CO LTD3 citations54
US9659641B2May 23, 2017
On-chip resistance measurement circuit and resistive memory device including the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US8050087B2Nov 1, 2011
Non-volatile memory device including block state confirmation cell and method of operating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US9654118B2May 16, 2017
Phase-rotating phase locked loop and method of controlling operation thereof
SAMSUNG ELECTRONICS CO LTD1 citations51
US9385730B2Jul 5, 2016
Phase-rotating phase locked loop and method of controlling operation thereof
SAMSUNG ELECTRONICS CO LTD1 citations51
US10395719B2Aug 27, 2019
Memory device driving matching lines according to priority
SAMSUNG ELECTRONICS CO LTD0 citations44