P

Inventor

KANEKO HISASHI

JP85 patents
⚠️ This page may combine multiple inventors who share the name “KANEKO HISASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

38 patents
US6071810AJun 6, 2000

Method of filling contact holes and wiring grooves of a semiconductor device

TOSHIBA KK101 citations99
US6563308B2May 13, 2003

Eddy current loss measuring sensor, thickness measuring system, thickness measuring method, and recorded medium

TOSHIBA KK144 citations98
US6375823B1Apr 23, 2002

Plating method and plating apparatus

TOSHIBA KK96 citations98
US6348402B1Feb 19, 2002

Method of manufacturing a copper interconnect

TOSHIBA KK87 citations98
US6229211B1May 8, 2001

Semiconductor device and method of manufacturing the same

TOSHIBA KK88 citations98
US5953634ASep 14, 1999

Method of manufacturing semiconductor device

TOSHIBA KK103 citations98
US5770095AJun 23, 1998

Polishing agent and polishing method using the same

TOSHIBA KK413 citations98
US6727593B2Apr 27, 2004

Semiconductor device with improved bonding

TOSHIBA KK48 citations96
US6673704B2Jan 6, 2004

Semiconductor device and method of manufacturing the same

TOSHIBA KK42 citations96
US6403481B1Jun 11, 2002

Film formation method

TOSHIBA KK55 citations96
US6306756B1Oct 23, 2001

Method for production of semiconductor device

TOSHIBA KK62 citations96
US6291891B1Sep 18, 2001

Semiconductor device manufacturing method and semiconductor device

TOSHIBA KK69 citations96
US6150270ANov 21, 2000

Method for forming barrier layer for copper metallization

TOSHIBA KK54 citations96
US6090701AJul 18, 2000

Method for production of semiconductor device

TOSHIBA KK74 citations96
US5664989ASep 9, 1997

Polishing pad, polishing apparatus and polishing method

TOSHIBA KK74 citations96
US5409862AApr 25, 1995

Method for making aluminum single crystal interconnections on insulators

TOSHIBA KK56 citations96
US7921401B2Apr 5, 2011

Stress analysis method, wiring structure design method, program, and semiconductor device production method

TOSHIBA KK35 citations93
US6913681B2Jul 5, 2005

Plating method and plating apparatus

TOSHIBA KK20 citations93
US6670714B1Dec 30, 2003

Semiconductor integrated circuit device having multilevel interconnection

TOSHIBA KK22 citations93
US6611060B1Aug 26, 2003

Semiconductor device having a damascene type wiring layer

TOSHIBA KK26 citations93
US6579785B2Jun 17, 2003

Method of making multi-level wiring in a semiconductor device

TOSHIBA KK31 citations93
US6342444B1Jan 29, 2002

Method of forming diffusion barrier for copper interconnects

TOSHIBA KK32 citations93
US5661345AAug 26, 1997

Semiconductor device having a single-crystal metal wiring

TOSHIBA KK35 citations93
US6555925B1Apr 29, 2003

Semiconductor device and producing method thereof

TOSHIBA KK33 citations92
US6552434B2Apr 22, 2003

Semiconductor device and manufacturing method thereof

TOSHIBA KK18 citations92
US6518177B1Feb 11, 2003

Method of manufacturing a semiconductor device

TOSHIBA KK23 citations92
US6403462B1Jun 11, 2002

Method for manufacturing high reliability interconnection having diffusion barrier layer

TOSHIBA KK16 citations92
US6368951B2Apr 9, 2002

Semiconductor device manufacturing method and semiconductor device

TOSHIBA KK16 citations92
US6054770AApr 25, 2000

Electric solid state device and method for manufacturing the device

TOSHIBA KK35 citations92
US6001461ADec 14, 1999

Electronic parts and manufacturing method thereof

TOSHIBA KK44 citations92
US5709958AJan 20, 1998

Electronic parts

TOSHIBA KK48 citations92
US5629236AMay 13, 1997

Method of manufacture of semiconductor device

TOSHIBA KK40 citations92
US5187561AFeb 16, 1993

Metal single crystal line having a particular crystal orientation

TOSHIBA KK21 citations92
US6407453B1Jun 18, 2002

Semiconductor device and method of manufacturing the same

TOSHIBA KK32 citations90
US7996813B2Aug 9, 2011

Method for generating pattern, method for manufacturing semiconductor device, semiconductor device, and computer program

TOSHIBA KK9 citations84
US7635646B2Dec 22, 2009

Method for fabricating semiconductor device

TOSHIBA KK12 citations84
US7238919B2Jul 3, 2007

Heating element movement bonding method for semiconductor components

TOSHIBA KK13 citations84
US7214305B2May 8, 2007

Method of manufacturing electronic device

TOSHIBA KK12 citations84

FUJITSU LTD

9 patents

EBARA CORP

2 patents

IBIDEN CO LTD

1 patent

Showing the top 50 of 85 patents by PatentIndex Score.