P

Inventor

LI KUN-HSI

TW18 patents
⚠️ This page may combine multiple inventors who share the name “LI KUN-HSI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

13 patents
US10483971B1Nov 19, 2019

Physical unclonable device and method of maximizing existing process variation for a physically unclonable device

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10483267B2Nov 19, 2019

Eight-transistor static random-access memory, layout thereof, and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations80
US10958270B2Mar 23, 2021

Physical unclonable device and method of maximizing existing process variation for a physically unclonable device

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10872896B2Dec 22, 2020

Eight-transistor static random access memory, layout thereof, and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US11210165B2Dec 28, 2021

Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory array

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11962693B2Apr 16, 2024

Integrated circuit (IC) signatures with random number generator and one-time programmable device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11528135B2Dec 13, 2022

Integrated circuit (IC) signatures with random number generator and one-time programmable device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12082388B2Sep 3, 2024

Eight-transistor static random access memory, layout thereof, and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11832429B2Nov 28, 2023

Eight-transistor static random access memory, layout thereof, and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US10838809B2Nov 17, 2020

Memory array and measuring and testing methods for inter-hamming differences of memory array

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10372532B2Aug 6, 2019

Memory array and measuring and testing methods for inter-hamming differences of memory array

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12348626B2Jul 1, 2025

Integrated circuit (IC) signatures with random number generator and one-time programmable device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10515710B2Dec 24, 2019

Hamming-distance analyzer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41

TEXAS INSTRUMENTS INC

1 patent

CHANG JONATHAN TSUNG-YUNG

1 patent

WU JUI-JEN

1 patent

TAIWAN SEMICONDUCTOR MFG

1 patent

CHEN YEN-HUEI

1 patent