Inventor
LI KUN-HSI
TW18 patents
⚠️ This page may combine multiple inventors who share the name “LI KUN-HSI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
13 patentsUS10483971B1Nov 19, 2019
Physical unclonable device and method of maximizing existing process variation for a physically unclonable device
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10483267B2Nov 19, 2019
Eight-transistor static random-access memory, layout thereof, and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations80
US10958270B2Mar 23, 2021
Physical unclonable device and method of maximizing existing process variation for a physically unclonable device
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10872896B2Dec 22, 2020
Eight-transistor static random access memory, layout thereof, and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US11210165B2Dec 28, 2021
Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory array
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11962693B2Apr 16, 2024
Integrated circuit (IC) signatures with random number generator and one-time programmable device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11528135B2Dec 13, 2022
Integrated circuit (IC) signatures with random number generator and one-time programmable device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12082388B2Sep 3, 2024
Eight-transistor static random access memory, layout thereof, and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11832429B2Nov 28, 2023
Eight-transistor static random access memory, layout thereof, and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US10838809B2Nov 17, 2020
Memory array and measuring and testing methods for inter-hamming differences of memory array
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10372532B2Aug 6, 2019
Memory array and measuring and testing methods for inter-hamming differences of memory array
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12348626B2Jul 1, 2025
Integrated circuit (IC) signatures with random number generator and one-time programmable device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10515710B2Dec 24, 2019
Hamming-distance analyzer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41