P

Inventor

NEO YOICHIRO

JP7 patents
⚠️ This page may combine multiple inventors who share the name “NEO YOICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

4 patents
US6859060B2Feb 22, 2005

Inspection method of semiconductor device and inspection system

HITACHI LTD14 citations82
US6924482B2Aug 2, 2005

Method of inspecting pattern and inspecting instrument

HITACHI LTD5 citations72
US7876113B2Jan 25, 2011

Method of inspecting pattern and inspecting instrument

HITACHI LTD0 citations51
US7375538B2May 20, 2008

Method of inspecting pattern and inspecting instrument

HITACHI LTD0 citations51

(unassigned)

1 patent
US6586952B2Jul 1, 2003

Method of inspecting pattern and inspecting instrument

28 citations91

MATSUMOTO TAKAHIRO

1 patent
US8405294B2Mar 26, 2013

Field emission electron source

MATSUMOTO TAKAHIRO0 citations50

NAGAO MASAYOSHI

1 patent
US9024544B2May 5, 2015

Field emission device

NAGAO MASAYOSHI0 citations32