Inventor
COTA KEVIN
US8 patents
⚠️ This page may combine multiple inventors who share the name “COTA KEVIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
6 patentsUS6807655B1Oct 19, 2004
Adaptive off tester screening method based on intrinsic die parametric measurements
LSI LOGIC CORP107 citations96
US6943042B2Sep 13, 2005
Method of detecting spatially correlated variations in a parameter of an integrated circuit die
LSI LOGIC CORP19 citations91
US6787379B1Sep 7, 2004
Method of detecting spatially correlated variations in a parameter of an integrated circuit die
LSI LOGIC CORP17 citations91
US6598194B1Jul 22, 2003
Test limits based on position
LSI LOGIC CORP31 citations88
US6782500B1Aug 24, 2004
Statistical decision system
LSI LOGIC CORP7 citations69
US6880140B2Apr 12, 2005
Method to selectively identify reliability risk die based on characteristics of local regions on the wafer
LSI LOGIC CORP2 citations60