Inventor
YAMADA MASUHIRO
JP5 patents
Patents
5 patentsUS5764093AJun 9, 1998
Variable delay circuit
ADVANTEST CORP21 citations91
US5495197AFeb 27, 1996
Variable delay circuit
ADVANTEST CORP23 citations91
US6047393AApr 4, 2000
Memory testing apparatus
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US7441166B2Oct 21, 2008
Testing apparatus and testing method
ADVANTEST CORP9 citations82
US7782064B2Aug 24, 2010
Test apparatus and test module
ADVANTEST CORP4 citations61