Inventor

YASUTAKE MASATOSHI

JP51 patents

⚠️ This page may combine multiple inventors who share the name “YASUTAKE MASATOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

YASUTAKE MASATOSHI

SEIKO INSTR INC

Composite scanning tunneling microscope

Composite scanning tunnelling microscope with a positioning function

Scanning tunneling microscope

Probe scanning device

Scanning probe microscope and method for obtaining topographic image, surface potential image, and electrostatic capacitance distribution image

Scanning probe microscope

Surface analyzing and processing apparatus

Scanning probe microscope having a directional coupler and a Z-direction distance adjusting piezoelectric element

Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same

Three-dimensional scanning probe microscope

Method for analyzing minute foreign substance elements

Sampling scanning probe microscope and sampling method thereof

Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field

Scanning probe microscope

Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof

Scanning probe microscope

Probe scanning apparatus

Microelectronic processing machine

Alignment assembly for aligning a spring element with a laser beam in a probe microscope

Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope

Scanning probe microscope and micro-area processing machine both having micro-positioning mechanism

SII NANOTECHNOLOGY INC

Probe for scanning probe microscope

Probe microscope system suitable for observing sample of long body

Positioning apparatus and scanning probe microscope employing the same

Sample manipulating apparatus

Sample operation apparatus

Sample operation apparatus

Method of processing vertical cross-section using atomic force microscope

Processing method using probe of scanning probe microscope

Scanning probe microscope and scanning method

Processing probe

Method of removing particle of photomask using atomic force microscope

Method for fabricating nanometer-scale structure

Working method using scanning probe

MITSUBISHI ELECTRIC CORP

Optical scanning system utilizing an atomic force microscope and an optical microscope

Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same

Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof

NAKAYAMA YOSHIKAZU

Conductive probe for scanning microscope and machining method using the same

Cantilever for vertical scanning microscope and probe for vertical scan microscope

Probe for a scanning microscope

AOI ELECTRONICS CO LTD

AFM tweezers, method for producing AFM tweezers, and scanning probe microscope

Tweezer-equipped scanning probe microscope and transfer method

HITACHI HIGH TECH CORP

Particle measuring device and particle measuring method

Sample for measuring particles, method for measuring particles and apparatus for measuring particles

YOSHIKAZU NAKAYAMA

Probe for scanning microscope produced by focused ion beam machining

NAT INST OF ADVANCED IND SCIEN

Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes

SEIKO INSTR & ELECTRONICS

Method and apparatus for determining photo-chemical reaction heat

HAYASHI HIROKI

Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus

YASUTAKE MASATOSHI

Friction force microscope

IWATA FUTOSHI

Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method