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Inventor
ARNZEN DANIEL J
US
2 patents
Patents
2 patents
US6833622B1
Dec 21, 2004
Semiconductor topography having an inactive region formed from a dummy structure pattern
CYPRESS SEMICONDUCTOR CORP
17 citations
79
US7129178B1
Oct 31, 2006
Reducing defect formation within an etched semiconductor topography
CYPRESS SEMICONDUCTOR CORP
17 citations
78