Inventor

KINNEY PATRICK D

US14 patents

⚠️ This page may combine multiple inventors who share the name “KINNEY PATRICK D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

5 patents

US5422724AJun 6, 1995

Multiple-scan method for wafer particle analysis

APPLIED MATERIALS INC56 citations95

US5985680ANov 16, 1999

Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system

APPLIED MATERIALS INC60 citations94

US5267017ANov 30, 1993

Method of particle analysis on a mirror wafer

APPLIED MATERIALS INC48 citations92

US6122562ASep 19, 2000

Method and apparatus for selectively marking a semiconductor wafer

APPLIED MATERIALS INC43 citations91

US5870187AFeb 9, 1999

Method for aligning semiconductor wafer surface scans and identifying added and removed particles resulting from wafer handling or processing

APPLIED MATERIALS INC16 citations71

REAL TIME METROLOGY INC

2 patents

US6809809B2Oct 26, 2004

Optical method and apparatus for inspecting large area planar objects

REAL TIME METROLOGY INC119 citations96

US6630996B2Oct 7, 2003

Optical method and apparatus for inspecting large area planar objects

REAL TIME METROLOGY INC161 citations96

APPLERA CORP

2 patents

US7394943B2Jul 1, 2008

Methods, software, and apparatus for focusing an optical system using computer image analysis

APPLERA CORP27 citations89

US7045756B2May 16, 2006

Methods and systems for in situ calibration of imaging in biological analysis

APPLERA CORP9 citations71

APPLIED BIOSYSTEMS LLC

2 patents

US7875425B2Jan 25, 2011

Methods for monitoring polymerase chain reactions

APPLIED BIOSYSTEMS LLC1 citations51

US7541567B2Jun 2, 2009

Methods and systems for in situ validation of imaging in biological analysis

APPLIED BIOSYSTEMS LLC0 citations49

MICROTHERM LLC

1 patent

US5909276AJun 1, 1999

Optical inspection module and method for detecting particles and defects on substrates in integrated process tools

MICROTHERM LLC210 citations96

KINNEY PATRICK D

1 patent

US8602958B1Dec 10, 2013

Methods and assemblies for collecting liquid by centrifugation

KINNEY PATRICK D6 citations65

LIFE TECHNOLOGIES CORP

1 patent

US7928354B2Apr 19, 2011

Methods and systems for in situ calibration of imaging in biological analysis

LIFE TECHNOLOGIES CORP0 citations49