Inventor
PEI SHIYOU
US26 patents
⚠️ This page may combine multiple inventors who share the name “PEI SHIYOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CANDESCENT TECH CORP
10 patentsUS6853129B1Feb 8, 2005
Protected substrate structure for a field emission display device
CANDESCENT TECH CORP358 citations98
US6630786B2Oct 7, 2003
Light-emitting device having light-reflective layer formed with, or/and adjacent to, material that enhances device performance
CANDESCENT TECH CORP213 citations98
US6861798B1Mar 1, 2005
Tailored spacer wall coatings for reduced secondary electron emission
CANDESCENT TECH CORP42 citations92
US6812636B2Nov 2, 2004
Light-emitting device having light-emissive particles partially coated with light-reflective or/and getter material
CANDESCENT TECH CORP26 citations92
US6617772B1Sep 9, 2003
Flat-panel display having spacer with rough face for inhibiting secondary electron escape
CANDESCENT TECH CORP22 citations92
US6403209B1Jun 11, 2002
Constitution and fabrication of flat-panel display and porous-faced structure suitable for partial or full use in spacer of flat-panel display
CANDESCENT TECH CORP19 citations92
US6734608B1May 11, 2004
Constitution and fabrication of flat-panel display and porous-faced structure suitable for partial of full use in spacer of flat-panel display
CANDESCENT TECH CORP8 citations74
US6741027B1May 25, 2004
Protected substrate structure for a field emission display device
CANDESCENT TECH CORP4 citations62
US7002287B1Feb 21, 2006
Protected substrate structure for a field emission display device
CANDESCENT TECH CORP0 citations49
US6873097B2Mar 29, 2005
Cleaning of cathode-ray tube display
CANDESCENT TECH CORP0 citations45
KLA TENCOR TECH CORP
7 patentsUS7893703B2Feb 22, 2011
Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer
KLA TENCOR TECH CORP104 citations96
US7103484B1Sep 5, 2006
Non-contact methods for measuring electrical thickness and determining nitrogen content of insulating films
KLA TENCOR TECH CORP54 citations92
US7110238B1Sep 19, 2006
Systems and methods for using non-contact voltage sensors and corona discharge guns
KLA TENCOR TECH CORP11 citations81
US7098050B1Aug 29, 2006
Corona based charge voltage measurement
KLA TENCOR TECH CORP6 citations71
US6909291B1Jun 21, 2005
Systems and methods for using non-contact voltage sensors and corona discharge guns
KLA TENCOR TECH CORP9 citations70
US7187186B2Mar 6, 2007
Methods and systems for determining one or more properties of a specimen
KLA TENCOR TECH CORP6 citations59
US7345306B1Mar 18, 2008
Corona based charge voltage measurement
KLA TENCOR TECH CORP0 citations49