Inventor

KUCZERA GABRIELE

DE4 patents

Patents

4 patents

US9977053B2May 22, 2018

Wafer probe alignment

IBM4 citations69

US9927463B2Mar 27, 2018

Wafer probe alignment

IBM2 citations69

US9921268B2Mar 20, 2018

Auto-alignment of backer plate for direct docking test boards

IBM0 citations47

US9726719B2Aug 8, 2017

Semiconductor automatic test equipment

IBM0 citations36