Inventor
JOHS BLAINE D
US102 patents
⚠️ This page may combine multiple inventors who share the name “JOHS BLAINE D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
J A WOOLLAM CO INC
40 patentsUS7907280B2Mar 15, 2011
Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation
J A WOOLLAM CO INC94 citations98
US7633625B1Dec 15, 2009
Spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC115 citations98
US7460230B2Dec 2, 2008
Deviation angle self compensating substantially achromatic retarder
J A WOOLLAM CO INC108 citations97
US7450231B2Nov 11, 2008
Deviation angle self compensating substantially achromatic retarder
J A WOOLLAM CO INC105 citations97
US6937341B1Aug 30, 2005
System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation
J A WOOLLAM CO INC96 citations97
US5963327AOct 5, 1999
Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems
J A WOOLLAM CO INC69 citations96
US5963325AOct 5, 1999
Dual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC47 citations96
US5956145ASep 21, 1999
System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems
J A WOOLLAM CO INC85 citations96
US5757494AMay 26, 1998
System and method for improving data acquisition capability in spectroscopic ellipsometers
J A WOOLLAM CO INC77 citations96
US5666201ASep 9, 1997
Multiple order dispersive optics system and method of use
J A WOOLLAM CO INC95 citations96
US5521706AMay 28, 1996
System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
J A WOOLLAM CO INC107 citations96
US5504582AApr 2, 1996
System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
J A WOOLLAM CO INC83 citations94
US7492455B1Feb 17, 2009
Discrete polarization state spectroscopic ellipsometer system and method of use
J A WOOLLAM CO INC22 citations93
US7158231B1Jan 2, 2007
Spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC26 citations93
US7075650B1Jul 11, 2006
Discrete polarization state spectroscopic ellipsometer system and method of use
J A WOOLLAM CO INC22 citations93
US6822738B1Nov 23, 2004
Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
J A WOOLLAM CO INC34 citations93
US6804004B1Oct 12, 2004
Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry
J A WOOLLAM CO INC21 citations93
US6795184B1Sep 21, 2004
Odd bounce image rotation system in ellipsometer systems
J A WOOLLAM CO INC24 citations93
US6456376B1Sep 24, 2002
Rotating compensator ellipsometer system with spatial filter
J A WOOLLAM CO INC42 citations93
US6353477B1Mar 5, 2002
Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
J A WOOLLAM CO INC39 citations93
US6268917B1Jul 31, 2001
Combined polychromatic electromagnetic beam source system with application to ellipsometers, spectrophotometers and polarimeters
J A WOOLLAM CO INC31 citations93
US6118537ASep 12, 2000
Multiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC39 citations93
US6100981AAug 8, 2000
Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC38 citations93
US6084675AJul 4, 2000
Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC48 citations93
US6084674AJul 4, 2000
Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC36 citations93
US6034777AMar 7, 2000
Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems
J A WOOLLAM CO INC45 citations93
US5969818AOct 19, 1999
Beam folding optics system and method of use with application in ellipsometry and polarimetry
J A WOOLLAM CO INC21 citations93
US5946098AAug 31, 1999
Optical elements for use in spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC41 citations93
US5936734AAug 10, 1999
Analysis of partially polarized electromagnetic radiation in ellipsometer and polarimeter systems
J A WOOLLAM CO INC56 citations93
US5929995AJul 27, 1999
System and method for directing electromagnetic beams
J A WOOLLAM CO INC23 citations93
US6982792B1Jan 3, 2006
Spectrophotometer, ellipsometer, polarimeter and the like systems
J A WOOLLAM CO INC49 citations92
US6859278B1Feb 22, 2005
Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems
J A WOOLLAM CO INC29 citations92
US5805285ASep 8, 1998
Multiple order dispersive optics system and method of use
J A WOOLLAM CO INC43 citations92
US5582646ADec 10, 1996
Ellipsometer/polarimeter based process monitor and control system suitable for simultaneous retrofit on molecular beam epitaxy system RHEED/LEED interface system, and method of use
J A WOOLLAM CO INC43 citations92
US7746472B1Jun 29, 2010
Automated ellipsometer and the like systems
J A WOOLLAM CO INC8 citations84
US7746471B1Jun 29, 2010
Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems
J A WOOLLAM CO INC13 citations84
US7705995B1Apr 27, 2010
Method of determining substrate etch depth
J A WOOLLAM CO INC11 citations84
US7505134B1Mar 17, 2009
Automated ellipsometer and the like systems
J A WOOLLAM CO INC15 citations84
US7468794B1Dec 23, 2008
Rotating compensator ellipsometer system with spatial filter equivalent
J A WOOLLAM CO INC12 citations84
US7336361B1Feb 26, 2008
Spectroscopic ellipsometer and polarimeter systems
J A WOOLLAM CO INC15 citations84
UNIV NEBRASKA
3 patentsJ A WOOLLAM CO
2 patentsLIPHARDT MARTIN M
2 patents(unassigned)
1 patentJAMES D WELCH
1 patentJ A WOOLAM CO INC
1 patentShowing the top 50 of 102 patents by PatentIndex Score.