P

Inventor

HE PING

US139 patents
⚠️ This page may combine multiple inventors who share the name “HE PING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

J A WOOLLAM CO INC

33 patents
US7633625B1Dec 15, 2009

Spectroscopic ellipsometer and polarimeter systems

J A WOOLLAM CO INC115 citations98
US5963327AOct 5, 1999

Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems

J A WOOLLAM CO INC69 citations96
US5666201ASep 9, 1997

Multiple order dispersive optics system and method of use

J A WOOLLAM CO INC95 citations96
US7492455B1Feb 17, 2009

Discrete polarization state spectroscopic ellipsometer system and method of use

J A WOOLLAM CO INC22 citations93
US7158231B1Jan 2, 2007

Spectroscopic ellipsometer and polarimeter systems

J A WOOLLAM CO INC26 citations93
US7075650B1Jul 11, 2006

Discrete polarization state spectroscopic ellipsometer system and method of use

J A WOOLLAM CO INC22 citations93
US6804004B1Oct 12, 2004

Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry

J A WOOLLAM CO INC21 citations93
US6456376B1Sep 24, 2002

Rotating compensator ellipsometer system with spatial filter

J A WOOLLAM CO INC42 citations93
US5969818AOct 19, 1999

Beam folding optics system and method of use with application in ellipsometry and polarimetry

J A WOOLLAM CO INC21 citations93
US6982792B1Jan 3, 2006

Spectrophotometer, ellipsometer, polarimeter and the like systems

J A WOOLLAM CO INC49 citations92
US6859278B1Feb 22, 2005

Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems

J A WOOLLAM CO INC29 citations92
US5805285ASep 8, 1998

Multiple order dispersive optics system and method of use

J A WOOLLAM CO INC43 citations92
US7872751B2Jan 18, 2011

Fast sample height, AOI and POI alignment in mapping ellipsometer or the like

J A WOOLLAM CO INC10 citations84
US7746471B1Jun 29, 2010

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

J A WOOLLAM CO INC13 citations84
US7746472B1Jun 29, 2010

Automated ellipsometer and the like systems

J A WOOLLAM CO INC8 citations84
US7505134B1Mar 17, 2009

Automated ellipsometer and the like systems

J A WOOLLAM CO INC15 citations84
US7468794B1Dec 23, 2008

Rotating compensator ellipsometer system with spatial filter equivalent

J A WOOLLAM CO INC12 citations84
US7336361B1Feb 26, 2008

Spectroscopic ellipsometer and polarimeter systems

J A WOOLLAM CO INC15 citations84
US7230699B1Jun 12, 2007

Sample orientation system and method

J A WOOLLAM CO INC11 citations84
US7274450B1Sep 25, 2007

Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems

J A WOOLLAM CO INC19 citations83
US7567345B1Jul 28, 2009

Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample

J A WOOLLAM CO INC8 citations82
US6549282B1Apr 15, 2003

Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems

J A WOOLLAM CO INC16 citations81
US7489400B1Feb 10, 2009

System and method of applying xenon arc-lamps to provide 193 nm wavelengths

J A WOOLLAM CO INC7 citations74
US7304737B1Dec 4, 2007

Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence

J A WOOLLAM CO INC8 citations74
US7265838B1Sep 4, 2007

Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like

J A WOOLLAM CO INC8 citations74
US7245376B2Jul 17, 2007

Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter

J A WOOLLAM CO INC9 citations74
US7193710B1Mar 20, 2007

Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses

J A WOOLLAM CO INC9 citations74
US10627288B1Apr 21, 2020

Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multielement detector, while maintaining information content therein

J A WOOLLAM CO INC3 citations73
US10338362B1Jul 2, 2019

Beam focusing and reflecting optics with enhanced detector system

J A WOOLLAM CO INC3 citations73
US10066989B1Sep 4, 2018

Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams

J A WOOLLAM CO INC2 citations73
US9921395B1Mar 20, 2018

Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area

J A WOOLLAM CO INC3 citations73
US9500843B1Nov 22, 2016

Beam focusing and beam collecting optics

J A WOOLLAM CO INC4 citations73
US9442016B2Sep 13, 2016

Reflective focusing optics

J A WOOLLAM CO INC4 citations73

(unassigned)

4 patents

UNIV WRIGHT STATE

2 patents

LIPHARDT MARTIN M

2 patents

WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD

2 patents

GP ENTPR CO LTD

2 patents

JAMES D WELCH

1 patent

AGENCY SCIENCE TECH & RES

1 patent

MAYO MEDICAL RESOURCES

1 patent

PALLAPOTHU SATEESH

1 patent

J A WOOLLAN CO INC

1 patent

Showing the top 50 of 139 patents by PatentIndex Score.