Inventor

GOEDEN CHRISTOPHER A

US16 patents

⚠️ This page may combine multiple inventors who share the name “GOEDEN CHRISTOPHER A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

J A WOOLLAM CO INC

14 patents

US6859278B1Feb 22, 2005

Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems

J A WOOLLAM CO INC29 citations92

US7746472B1Jun 29, 2010

Automated ellipsometer and the like systems

J A WOOLLAM CO INC8 citations84

US7746471B1Jun 29, 2010

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

J A WOOLLAM CO INC13 citations84

US7505134B1Mar 17, 2009

Automated ellipsometer and the like systems

J A WOOLLAM CO INC15 citations84

US7136172B1Nov 14, 2006

System and method for setting and compensating errors in AOI and POI of a beam of EM radiation

J A WOOLLAM CO INC15 citations84

US7265838B1Sep 4, 2007

Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like

J A WOOLLAM CO INC8 citations74

US7522279B1Apr 21, 2009

System for and method of investigating the exact same point on a sample substrate with multiple wavelengths

J A WOOLLAM CO INC4 citations63

US7057717B1Jun 6, 2006

System for and method of investigating the exact same point on a sample substrate with at least two wavelengths

J A WOOLLAM CO INC2 citations63

US7796260B1Sep 14, 2010

Ellipsometer or polarimeter and the like system with beam chromatic shifting and directing means

J A WOOLLAM CO INC3 citations62

US7301631B1Nov 27, 2007

Control of uncertain angle of incidence of beam from Arc lamp

J A WOOLLAM CO INC0 citations52

US9546943B1Jan 17, 2017

System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressure

J A WOOLLAM CO INC0 citations34

J A WOOLLAN CO INC

1 patent

US7277171B1Oct 2, 2007

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

J A WOOLLAN CO INC18 citations80

J A WOOLIAM CO INC

1 patent

US7508510B2Mar 24, 2009

System for and method of investigating the exact same point on a sample substrate with multiple wavelengths

J A WOOLIAM CO INC1 citations46

GOEDEN CHRISTOPHER A

J A WOOLLAM CO INC

Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

Automated ellipsometer and the like systems

System and method for setting and compensating errors in AOI and POI of a beam of EM radiation

Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like

System for and method of investigating the exact same point on a sample substrate with multiple wavelengths

System for and method of investigating the exact same point on a sample substrate with at least two wavelengths

System and method of controlling intensity of an electromagnetic beam

Sample orientation system and method

Beam chromatic shifting and directing means

Ellipsometer or polarimeter and the like system with beam chromatic shifting and directing means

Control of uncertain angle of incidence of beam from Arc lamp

System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressure

J A WOOLLAN CO INC

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

J A WOOLIAM CO INC

System for and method of investigating the exact same point on a sample substrate with multiple wavelengths