Inventor

WOOLLAM JOHN A

US64 patents

⚠️ This page may combine multiple inventors who share the name “WOOLLAM JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WOOLLAM JOHN A

J A WOOLLAM CO INC

Spectroscopic ellipsometer and polarimeter systems

System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation

System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems

System and method for improving data acquisition capability in spectroscopic ellipsometers

Multiple order dispersive optics system and method of use

System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system

System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system

Spectroscopic ellipsometer and polarimeter systems

Spectrophotometer, ellipsometer, polarimeter and the like systems

Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems

Multiple order dispersive optics system and method of use

Ellipsometer/polarimeter based process monitor and control system suitable for simultaneous retrofit on molecular beam epitaxy system RHEED/LEED interface system, and method of use

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

Automated ellipsometer and the like systems

Automated ellipsometer and the like systems

Spectroscopic ellipsometer and polarimeter systems

System for sequentially providing aberation corrected electromagnetic radiation to a spot on a sample at multiple angles of incidence

Application of intermediate wavelength band spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters

Application of spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters

Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample

Sample analysis methodology utilizing electromagnetic radiation

Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems

Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use

Control of beam spot size in ellipsometer and the like systems

Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence

Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface

Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like

Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter

Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses

Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of accumulated material

Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use

Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast

Sample investigating system

System for and method of investigating the exact same point on a sample substrate with multiple wavelengths

System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems

System for reducing stress induced effects during determination of fluid optical constants

Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples

UNIV NEBRASKA

Small modulation ellipsometry

Ellipsometer

Electromagnetic beam directing means-sample analysis system stage, and method of use

HERZINGER CRAIG M

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

NASA

Atomic hydrogen storage method and apparatus

Atomic hydrogen storage

JAMES D WELCH

Spectroscopic ellipsometer and polarimeter systems

J A WOOLLAM CO

Ellipsometer

J A WOOLLAN CO INC

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

US OF AMERICA ASTHE ADMINISTRA

Atomic hydrogen storage method and apparatus

SCHUBERT MATHIAS M

Birefringence imaging chromatography based on highly ordered 3D nanostructures