P

Inventor

WELCH JAMES D

US55 patents
⚠️ This page may combine multiple inventors who share the name “WELCH JAMES D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

J A WOOLLAM CO INC

25 patents
US6859278B1Feb 22, 2005

Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems

J A WOOLLAM CO INC29 citations92
US7746471B1Jun 29, 2010

Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems

J A WOOLLAM CO INC13 citations84
US7746472B1Jun 29, 2010

Automated ellipsometer and the like systems

J A WOOLLAM CO INC8 citations84
US7505134B1Mar 17, 2009

Automated ellipsometer and the like systems

J A WOOLLAM CO INC15 citations84
US7426030B1Sep 16, 2008

Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems

J A WOOLLAM CO INC14 citations84
US7768660B1Aug 3, 2010

Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample

J A WOOLLAM CO INC12 citations83
US7489400B1Feb 10, 2009

System and method of applying xenon arc-lamps to provide 193 nm wavelengths

J A WOOLLAM CO INC7 citations74
US7345762B1Mar 18, 2008

Control of beam spot size in ellipsometer and the like systems

J A WOOLLAM CO INC8 citations74
US7283234B1Oct 16, 2007

Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface

J A WOOLLAM CO INC7 citations74
US7265838B1Sep 4, 2007

Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like

J A WOOLLAM CO INC8 citations74
US7030982B1Apr 18, 2006

Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of accumulated material

J A WOOLLAM CO INC8 citations74
US7522279B1Apr 21, 2009

System for and method of investigating the exact same point on a sample substrate with multiple wavelengths

J A WOOLLAM CO INC4 citations63
US7385698B1Jun 10, 2008

System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems

J A WOOLLAM CO INC4 citations63
US7317529B1Jan 8, 2008

Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples

J A WOOLLAM CO INC2 citations63
US7209234B2Apr 24, 2007

Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid

J A WOOLLAM CO INC3 citations63
US7057717B1Jun 6, 2006

System for and method of investigating the exact same point on a sample substrate with at least two wavelengths

J A WOOLLAM CO INC2 citations63
US6930813B1Aug 16, 2005

Spatial filter source beam conditioning in ellipsometer and the like systems

J A WOOLLAM CO INC3 citations63
US6590655B2Jul 8, 2003

System and method of improving electromagnetic radiation beam characteristics in ellipsometer and the like systems

J A WOOLLAM CO INC5 citations63
US7477388B1Jan 13, 2009

Sample masking in ellipsometer and the like systems including detection of substrate backside reflections

J A WOOLLAM CO INC6 citations62
US7151605B1Dec 19, 2006

Methodology for providing good data at all wavelengths over a spectroscopic range

J A WOOLLAM CO INC5 citations62
US7215423B1May 8, 2007

Control of beam spot size in ellipsometer and the like systems

J A WOOLLAM CO INC1 citations52
US11821833B2Nov 21, 2023

Fast and accurate Mueller matrix infrared ellipsometer

J A WOOLLAM CO INC0 citations51
US11740176B2Aug 29, 2023

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

J A WOOLLAM CO INC0 citations51
US11675208B1Jun 13, 2023

Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system

J A WOOLLAM CO INC0 citations51
US7253900B1Aug 7, 2007

Ellipsometer or polarimeter and the like system with multiple detector element detector in environmental control chamber including secure sample access

J A WOOLLAM CO INC1 citations51

WELCH JAMES D

16 patents

(unassigned)

5 patents

GETAGADGET INC

2 patents

J A WOOLLAN CO INC

1 patent

LIPHARDT MARTIN M

1 patent

Showing the top 50 of 55 patents by PatentIndex Score.