Inventor
WELCH JAMES D
US55 patents
⚠️ This page may combine multiple inventors who share the name “WELCH JAMES D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
J A WOOLLAM CO INC
25 patentsUS6859278B1Feb 22, 2005
Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems
J A WOOLLAM CO INC29 citations92
US7746471B1Jun 29, 2010
Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems
J A WOOLLAM CO INC13 citations84
US7746472B1Jun 29, 2010
Automated ellipsometer and the like systems
J A WOOLLAM CO INC8 citations84
US7505134B1Mar 17, 2009
Automated ellipsometer and the like systems
J A WOOLLAM CO INC15 citations84
US7426030B1Sep 16, 2008
Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems
J A WOOLLAM CO INC14 citations84
US7768660B1Aug 3, 2010
Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample
J A WOOLLAM CO INC12 citations83
US7489400B1Feb 10, 2009
System and method of applying xenon arc-lamps to provide 193 nm wavelengths
J A WOOLLAM CO INC7 citations74
US7345762B1Mar 18, 2008
Control of beam spot size in ellipsometer and the like systems
J A WOOLLAM CO INC8 citations74
US7283234B1Oct 16, 2007
Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface
J A WOOLLAM CO INC7 citations74
US7265838B1Sep 4, 2007
Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like
J A WOOLLAM CO INC8 citations74
US7030982B1Apr 18, 2006
Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of accumulated material
J A WOOLLAM CO INC8 citations74
US7522279B1Apr 21, 2009
System for and method of investigating the exact same point on a sample substrate with multiple wavelengths
J A WOOLLAM CO INC4 citations63
US7385698B1Jun 10, 2008
System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems
J A WOOLLAM CO INC4 citations63
US7317529B1Jan 8, 2008
Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples
J A WOOLLAM CO INC2 citations63
US7209234B2Apr 24, 2007
Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid
J A WOOLLAM CO INC3 citations63
US7057717B1Jun 6, 2006
System for and method of investigating the exact same point on a sample substrate with at least two wavelengths
J A WOOLLAM CO INC2 citations63
US6930813B1Aug 16, 2005
Spatial filter source beam conditioning in ellipsometer and the like systems
J A WOOLLAM CO INC3 citations63
US6590655B2Jul 8, 2003
System and method of improving electromagnetic radiation beam characteristics in ellipsometer and the like systems
J A WOOLLAM CO INC5 citations63
US7477388B1Jan 13, 2009
Sample masking in ellipsometer and the like systems including detection of substrate backside reflections
J A WOOLLAM CO INC6 citations62
US7151605B1Dec 19, 2006
Methodology for providing good data at all wavelengths over a spectroscopic range
J A WOOLLAM CO INC5 citations62
US7215423B1May 8, 2007
Control of beam spot size in ellipsometer and the like systems
J A WOOLLAM CO INC1 citations52
US11821833B2Nov 21, 2023
Fast and accurate Mueller matrix infrared ellipsometer
J A WOOLLAM CO INC0 citations51
US11740176B2Aug 29, 2023
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
J A WOOLLAM CO INC0 citations51
US11675208B1Jun 13, 2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system
J A WOOLLAM CO INC0 citations51
US7253900B1Aug 7, 2007
Ellipsometer or polarimeter and the like system with multiple detector element detector in environmental control chamber including secure sample access
J A WOOLLAM CO INC1 citations51
WELCH JAMES D
16 patentsUSD317363SJun 4, 1991
Decorative lamp
WELCH JAMES D42 citations92
USD259514SJun 9, 1981
Decorative lamp
WELCH JAMES D44 citations92
US4696093ASep 29, 1987
Fabrication of Schottky barrier MOSFETS
WELCH JAMES D18 citations74
US12136661B2Nov 5, 2024
Compact CMOS
WELCH JAMES D2 citations73
US11798946B2Oct 24, 2023
Compact FINFET CMOS
WELCH JAMES D2 citations73
USD661000SMay 29, 2012
Lamp
WELCH JAMES D3 citations63
USD661001SMay 29, 2012
Lamp
WELCH JAMES D3 citations63
USD661003SMay 29, 2012
Lamp
WELCH JAMES D3 citations63
USD661002SMay 29, 2012
Lamp
WELCH JAMES D4 citations63
USD660999SMay 29, 2012
Lamp
WELCH JAMES D5 citations63
US4623919ANov 18, 1986
Method and system for controlling access to transmitted modulated electromagnetic wave carried information
WELCH JAMES D3 citations63
US11744788B2Sep 5, 2023
Method of encouraging growth and regrowth of hair in human males technical area
WELCH JAMES D0 citations52
USD685934SJul 9, 2013
Lamp
WELCH JAMES D0 citations52
USD674519SJan 15, 2013
Lamp
WELCH JAMES D0 citations52
US8170920B1May 1, 2012
Method of providing audio format professional information update service, via an electronic network
WELCH JAMES D1 citations52
US7606735B1Oct 20, 2009
Method of providing audio format professional information update service for payment, via internet
WELCH JAMES D1 citations52
(unassigned)
5 patentsUS5663584ASep 2, 1997
Schottky barrier MOSFET systems and fabrication thereof
144 citations98
US5760449AJun 2, 1998
Regenerative switching CMOS system
67 citations96
US6268636B1Jul 31, 2001
Operation and biasing for single device equivalent to CMOS
34 citations92
US6624493B1Sep 23, 2003
Biasing, operation and parasitic current limitation in single device equivalent to CMOS, and other semiconductor systems
12 citations74
US6091128AJul 18, 2000
Semiconductor systems utilizing materials that form rectifying junctions in both N and P-type doping regions, whether metallurgically or field induced, and methods of use
9 citations74
GETAGADGET INC
2 patentsJ A WOOLLAN CO INC
1 patentLIPHARDT MARTIN M
1 patentShowing the top 50 of 55 patents by PatentIndex Score.