Inventor
BURDINE TODD M
US5 patents
Patents
5 patentsUS7234090B2Jun 19, 2007
Method and apparatus for selective scan chain diagnostics
IBM25 citations89
US7340496B2Mar 4, 2008
System and method for determining the Nth state of linear feedback shift registers
IBM9 citations83
US7089474B2Aug 8, 2006
Method and system for providing interactive testing of integrated circuits
IBM17 citations83
US7392449B2Jun 24, 2008
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
IBM7 citations72
US7395470B2Jul 1, 2008
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
IBM4 citations61