Inventor
ARABI TAWFIK R
US4 patents
Patents
4 patentsUS6671847B1Dec 30, 2003
I/O device testing method and apparatus
INTEL CORP73 citations92
US7348790B2Mar 25, 2008
AC testing of leakage current in integrated circuits using RC time constant
INTEL CORP2 citations57
US6777970B2Aug 17, 2004
AC testing of leakage current in integrated circuits using RC time constant
INTEL CORP1 citations57
US6967496B2Nov 22, 2005
AC testing of leakage current in integrated circuits using RC time constant
INTEL CORP2 citations55