Inventor
TERADA HIROTOSHI
JP36 patents
⚠️ This page may combine multiple inventors who share the name “TERADA HIROTOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HAMAMATSU PHOTONICS KK
32 patentsUS7576928B2Aug 18, 2009
Solid immersion lens holder
HAMAMATSU PHOTONICS KK8 citations84
US7576910B2Aug 18, 2009
Microscope and sample observation method
HAMAMATSU PHOTONICS KK8 citations82
US6973233B1Dec 6, 2005
Variable-wavelength optical output device
HAMAMATSU PHOTONICS KK13 citations79
US7139073B1Nov 21, 2006
Imaging apparatus
HAMAMATSU PHOTONICS KK10 citations74
US10578601B2Mar 3, 2020
Photostimulation device and photostimulation method
HAMAMATSU PHOTONICS KK2 citations73
US10312166B2Jun 4, 2019
Inspection system and inspection method
HAMAMATSU PHOTONICS KK4 citations73
US10302569B2May 28, 2019
Microscope device and image acquisition method
HAMAMATSU PHOTONICS KK3 citations73
US10073076B2Sep 11, 2018
Photostimulation device and photostimulation method
HAMAMATSU PHOTONICS KK3 citations73
US9891172B2Feb 13, 2018
Microscope device and image acquisition method
HAMAMATSU PHOTONICS KK2 citations73
US9784980B2Oct 10, 2017
Optical module and light exposure device
HAMAMATSU PHOTONICS KK2 citations73
US11391774B2Jul 19, 2022
Metalens unit, semiconductor fault analysis device, and semiconductor fault analysis method
HAMAMATSU PHOTONICS KK3 citations72
US5808746ASep 15, 1998
Photodetector apparatus
HAMAMATSU PHOTONICS KK8 citations71
US12216263B2Feb 4, 2025
Scanning microscope unit
HAMAMATSU PHOTONICS KK1 citations63
US11841393B2Dec 12, 2023
Cooling unit, objective lens module, semiconductor inspection device, and semiconductor inspection method
HAMAMATSU PHOTONICS KK0 citations62
US7865012B2Jan 4, 2011
Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program
HAMAMATSU PHOTONICS KK4 citations62
US7805691B2Sep 28, 2010
Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program
HAMAMATSU PHOTONICS KK6 citations62
US7423816B2Sep 9, 2008
Solid immersion lens and microscope
HAMAMATSU PHOTONICS KK2 citations62
US7359115B2Apr 15, 2008
Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the method
HAMAMATSU PHOTONICS KK2 citations62
US7221502B2May 22, 2007
Microscope and sample observation method
HAMAMATSU PHOTONICS KK6 citations62
US7149036B2Dec 12, 2006
Solid immersion lens and sample observation method using it
HAMAMATSU PHOTONICS KK3 citations62
US7046449B2May 16, 2006
Solid immersion lens and sample observation method using it
HAMAMATSU PHOTONICS KK2 citations62
US12117600B2Oct 15, 2024
Confocal microscope unit and confocal microscope
HAMAMATSU PHOTONICS KK0 citations61
US12078789B2Sep 3, 2024
Confocal microscope unit and confocal microscope
HAMAMATSU PHOTONICS KK0 citations61
US7312921B2Dec 25, 2007
Microscope and sample observation method
HAMAMATSU PHOTONICS KK3 citations61
US7110172B2Sep 19, 2006
Microscope and sample observation method
HAMAMATSU PHOTONICS KK3 citations61
US7230436B2Jun 12, 2007
Laser beam inspection equipment
HAMAMATSU PHOTONICS KK5 citations60
US11967061B2Apr 23, 2024
Semiconductor apparatus examination method and semiconductor apparatus examination apparatus
HAMAMATSU PHOTONICS KK0 citations59
US7453567B2Nov 18, 2008
Fluorescence lifetime distribution image measuring system and its measuring method
HAMAMATSU PHOTONICS KK2 citations58
US10607900B2Mar 31, 2020
Inspection system and inspection method
HAMAMATSU PHOTONICS KK0 citations52
US10558010B2Feb 11, 2020
Solid immersion lens holder and image acquisition device
HAMAMATSU PHOTONICS KK0 citations50
US10545309B2Jan 28, 2020
Solid immersion lens holder and image acquisition device
HAMAMATSU PHOTONICS KK0 citations50
US10495896B2Dec 3, 2019
Optical module and observation device
HAMAMATSU PHOTONICS KK0 citations42
TERADA HIROTOSHI
3 patentsUS8947776B2Feb 3, 2015
Suction apparatus, semiconductor device observation device, and semiconductor device observation method
TERADA HIROTOSHI4 citations71
US8582202B2Nov 12, 2013
Observing device and method
TERADA HIROTOSHI4 citations61
US8094389B2Jan 10, 2012
Solid immersion lens holder
TERADA HIROTOSHI5 citations61