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Inventor
TAKENOUCHI SHINYA
JP
2 patents
Patents
2 patents
US7330148B2
Feb 12, 2008
Measuring apparatus and measuring method
OMRON TATEISI ELECTRONICS CO
6 citations
58
US7548182B2
Jun 16, 2009
Radar device and radar method
OMRON TATEISI ELECTRONICS CO
4 citations
56