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Inventor
SCHNELL JOSEF T
US
2 patents
⚠️ This page may combine multiple inventors who share the name “SCHNELL JOSEF T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
1 patent
US6330697B1
Dec 11, 2001
Apparatus and method for performing a defect leakage screen test for memory devices
IBM
36 citations
88
SIEMENS AG
1 patent
US5847591A
Dec 8, 1998
Voltage detection circuit and internal voltage clamp circuit
SIEMENS AG
9 citations
66