Inventor
THIBERGE STEPHAN
FR3 patents
Patents
3 patentsUS7253418B2Aug 7, 2007
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
EL MUL TECHNOLOGIES LTD19 citations89
US6992300B2Jan 31, 2006
Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
EL MUL TECHNOLOGIES LTD28 citations89
US6989542B2Jan 24, 2006
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
EL MUL TECHNOLOGIES LTD20 citations89