Inventor
FUKAMI YOSHIYUKI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “FUKAMI YOSHIYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIHON MICRONICS KK
11 patentsUS9535108B2Jan 3, 2017
Inspection apparatus and inspection method
NIHON MICRONICS KK2 citations71
US11099227B2Aug 24, 2021
Multilayer wiring base plate and probe card using the same
NIHON MICRONICS KK2 citations69
US10989738B2Apr 27, 2021
Inspection apparatus and inspection method
NIHON MICRONICS KK0 citations61
US10295590B2May 21, 2019
Probe card with temperature control function, inspection apparatus using the same, and inspection method
NIHON MICRONICS KK1 citations61
US12244083B2Mar 4, 2025
Electrical connecting apparatus
NIHON MICRONICS KK1 citations60
US7960988B2Jun 14, 2011
Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
NIHON MICRONICS KK6 citations58
US12357771B2Jul 15, 2025
Blood vessel specifying device and blood vessel specifying method
NIHON MICRONICS KK0 citations49
US12171573B2Dec 24, 2024
Blood vessel position display device and blood vessel position display method
NIHON MICRONICS KK0 citations49
US9095071B2Jul 28, 2015
Multilayer wiring board and method for manufacturing the same
NIHON MICRONICS KK1 citations44
US9476934B2Oct 25, 2016
Inspection apparatus and inspection method for inspecting a wiring board
NIHON MICRONICS KK0 citations40
US10705122B2Jul 7, 2020
Probe card
NIHON MICRONICS KK0 citations38
MICRONICS JAPAN CO LTD
4 patentsUS7800384B2Sep 21, 2010
Probe unit substrate
MICRONICS JAPAN CO LTD2 citations60
US7659727B2Feb 9, 2010
Multilayer wiring board and method for testing the same
MICRONICS JAPAN CO LTD3 citations60
US7504843B2Mar 17, 2009
Probe unit substrate
MICRONICS JAPAN CO LTD2 citations60
US7656166B2Feb 2, 2010
Multilayer wiring board and method for testing the same
MICRONICS JAPAN CO LTD0 citations49