Inventor
MITSUNAGA TORU
JP8 patents
Patents
8 patentsUS9218315B2Dec 22, 2015
X-ray analysis apparatus
RIGAKU DENKI CO LTD4 citations70
US10876979B2Dec 29, 2020
Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
RIGAKU DENKI CO LTD1 citations59
USD566278SApr 8, 2008
X-ray analysis device
RIGAKU DENKI CO LTD2 citations53
US10837923B2Nov 17, 2020
X-ray analysis device and method for optical axis alignment thereof
RIGAKU DENKI CO LTD0 citations50
US9086367B2Jul 21, 2015
X-ray intensity correction method and X-ray diffractometer
RIGAKU DENKI CO LTD1 citations50
US10444168B2Oct 15, 2019
Method and apparatus for measuring bowing of single-crystal substrate
RIGAKU DENKI CO LTD0 citations39
US9322792B2Apr 26, 2016
X-ray diffraction apparatus and method of measuring X-ray diffraction
RIGAKU DENKI CO LTD0 citations39
US10732134B2Aug 4, 2020
X-ray diffraction apparatus
RIGAKU DENKI CO LTD0 citations38