Inventor

WEISS MARC JAY

US2 patents

⚠️ This page may combine multiple inventors who share the name “WEISS MARC JAY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

1 patent

US6258497B1Jul 10, 2001

Precise endpoint detection for etching processes

IBM38 citations85

SIEMENS AG

1 patent

US5670018ASep 23, 1997

Isotropic silicon etch process that is highly selective to tungsten

SIEMENS AG21 citations85