Inventor
PAREDIS KRISTOF
BE6 patents
Patents
6 patentsUS10746759B2Aug 18, 2020
Method for determining the shape of a sample tip for atom probe tomography
IMEC VZW2 citations66
US11112427B2Sep 7, 2021
Method and tip substrate for scanning probe microscopy
IMEC VZW0 citations54
US11125805B2Sep 21, 2021
Device for measuring surface characteristics of a material
IMEC VZW0 citations45
US10541108B2Jan 21, 2020
Method and apparatus for transmission electron microscopy
IMEC VZW0 citations45
US11549963B2Jan 10, 2023
Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
IMEC VZW0 citations41
US10495666B2Dec 3, 2019
Device and method for two dimensional active carrier profiling of semiconductor components
IMEC VZW0 citations31