Inventor

HASUMI TAKUYA

JP4 patents

⚠️ This page may combine multiple inventors who share the name “HASUMI TAKUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

3 patents

US7714600B2May 11, 2010

Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit

ADVANTEST CORP6 citations59

US7987062B2Jul 26, 2011

Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method

ADVANTEST CORP0 citations39

US7755407B2Jul 13, 2010

Variable delay circuit, testing apparatus, and electronic device

ADVANTEST CORP0 citations38

HASUMI TAKUYA

1 patent

US8058891B2Nov 15, 2011

Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method

HASUMI TAKUYA4 citations54