Inventor

SUDA MASAKATSU

JP44 patents

⚠️ This page may combine multiple inventors who share the name “SUDA MASAKATSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SUDA MASAKATSU

ADVANTEST CORP

Differential signal transmission circuit

Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuit

Variable delay circuit

Pulse width forming circuit

Timing generator and semiconductor test apparatus

Vernier delay circuit

Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

Timing generating apparatus and test apparatus

Delay circuit and ring oscillator

Timing generator for IC testers

Timing comparator, data sampling apparatus, and testing apparatus

Delay circuit, and testing apparatus

Delay circuit and test apparatus using delay element and buffer

Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuit

Delay device, semiconductor testing device, semiconductor device, and oscilloscope

Power consumption control circuit for CMOS circuit

Clock recovery circuit and communication device

Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording medium

Timing generator and semiconductor test apparatus

Test device, test method and computer readable media

Load fluctuation correction circuit, electronic device, testing device, and load fluctuation correction method

Electronic device, load fluctuation compensation circuit, power supply, and test apparatus

Test apparatus and test method

Timing generator and semiconductor testing apparatus

Delay device, semiconductor testing device, semiconductor device, and oscilloscope

Semiconductor device

Consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus

Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device

Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit

Measurement apparatus, measurement method and computer readable medium

Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device

Authentication terminal

Test apparatus, test method and computer readable medium

Variable delay circuit, timing generator and semiconductor testing apparatus

Oscillation circuit, test apparatus and electronic device

Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method

Authentication system, authentication method and service providing system

Variable delay circuit, testing apparatus, and electronic device

FUJIBE TASUKU

Semiconductor circuit with load balance circuit

Clock hand-off circuit

SUDA MASAKATSU

Signal generation and detection apparatus and tester

Timing generator and test apparatus

HASUMI TAKUYA

Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method

FUJITA KAZUHIRO

Loop type clock adjustment circuit and test device