Inventor
SHIN IN-DAE
KR2 patents
Patents
2 patentsUS6900653B2May 31, 2005
Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof
SAMSUNG ELECTRONICS CO LTD126 citations92
US7452438B2Nov 18, 2008
Method of fixing a probe needle to a needle fixture of a probe card in semiconductor inspection equipment
SAMSUNG ELECTRONICS CO LTD0 citations46