Inventor
KEEFE WILLIAM ROBERT
US2 patents
Patents
2 patentsUS10846882B2Nov 24, 2020
System and method of dimensional calibration for an analytical microscope
THERMO ELECTRON SCIENT INSTRUMENTS LLC2 citations65
US12019014B2Jun 25, 2024
Method and apparatus for determining a force applied to a sample during an optical interrogation technique
THERMO ELECTRON SCIENT INSTRUMENTS LLC0 citations46