Inventor
LIN SUNG-CHIEH
TW33 patents
⚠️ This page may combine multiple inventors who share the name “LIN SUNG-CHIEH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LIN SUNG-CHIEH
10 patentsUS8411483B2Apr 2, 2013
Testing one time programming devices
LIN SUNG-CHIEH7 citations84
US8467258B2Jun 18, 2013
Method and apparatus for bit cell repair
LIN SUNG-CHIEH10 citations83
US8400860B2Mar 19, 2013
Electrical fuse memory
LIN SUNG-CHIEH6 citations83
US8542549B2Sep 24, 2013
Electrical fuse bit cell
LIN SUNG-CHIEH6 citations72
US8847350B2Sep 30, 2014
Metal-via fuse
LIN SUNG-CHIEH2 citations62
US8824234B2Sep 2, 2014
Electrical fuse memory
LIN SUNG-CHIEH2 citations62
US8270240B2Sep 18, 2012
Current leakage reduction
LIN SUNG-CHIEH3 citations57
US8614927B2Dec 24, 2013
Current leakage reduction
LIN SUNG-CHIEH1 citations51
US8482952B2Jul 9, 2013
One time programming bit cell
LIN SUNG-CHIEH0 citations51
US8625324B2Jan 7, 2014
Non-salicide polysilicon fuse
LIN SUNG-CHIEH1 citations48
TAIWAN SEMICONDUCTOR MFG
7 patentsUS7733096B2Jun 8, 2010
Methods of testing fuse elements for memory devices
TAIWAN SEMICONDUCTOR MFG10 citations84
US6407368B1Jun 18, 2002
System for maintaining a flat zone temperature profile in LP vertical furnace
TAIWAN SEMICONDUCTOR MFG18 citations78
US9117506B2Aug 25, 2015
Tracking mechanism
TAIWAN SEMICONDUCTOR MFG4 citations73
US7919832B2Apr 5, 2011
Stack resistor structure for integrated circuits
TAIWAN SEMICONDUCTOR MFG2 citations63
US7551415B2Jun 23, 2009
Repair circuitry with an enhanced ESD protection device
TAIWAN SEMICONDUCTOR MFG4 citations63
US7394637B2Jul 1, 2008
Sense amplifier with leakage compensation for electrical fuses
TAIWAN SEMICONDUCTOR MFG2 citations62
US7462894B2Dec 9, 2008
Electrical fuse device with dummy cells for ESD protection
TAIWAN SEMICONDUCTOR MFG1 citations52
TAIWAN SEMICONDUCTOR MFG CO LTD
6 patentsUS9990985B1Jun 5, 2018
Memory device with determined time window
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9177668B2Nov 3, 2015
Method and apparatus for bit cell repair
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US9966378B2May 8, 2018
Integrated circuit structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9449888B2Sep 20, 2016
Integrated circuit structure to resolve deep-well plasma charging problem and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9412438B2Aug 9, 2016
Writing data to a memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US9558841B2Jan 31, 2017
Generating stabilized output signals during fuse read operations
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51