Inventor

ALPERN PETER

DE2 patents

⚠️ This page may combine multiple inventors who share the name “ALPERN PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SIEMENS AG

1 patent

US5034611AJul 23, 1991

Method for non-destructive identification for electronic inhomogeneities in semiconductor layers

SIEMENS AG33 citations89

INFINEON TECHNOLOGIES AG

1 patent

US6653732B2Nov 25, 2003

Electronic component having a semiconductor chip

INFINEON TECHNOLOGIES AG2 citations51