Inventor
KOE WERN-YAN
US9 patents
⚠️ This page may combine multiple inventors who share the name “KOE WERN-YAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC ELECTRONICS INC
3 patentsUS6480980B2Nov 12, 2002
Combinational test pattern generation method and apparatus
NEC ELECTRONICS INC84 citations95
US6385748B1May 7, 2002
Direct access logic testing in integrated circuits
NEC ELECTRONICS INC16 citations83
US6782502B2Aug 24, 2004
Combinational test pattern generation method and apparatus
NEC ELECTRONICS INC0 citations50
LSI LOGIC CORP
3 patentsUS6586969B1Jul 1, 2003
Method and system for synchronously initializing digital logic circuits
LSI LOGIC CORP14 citations82
US6895488B2May 17, 2005
DSP memory bank rotation
LSI LOGIC CORP8 citations69
US7043591B2May 9, 2006
Cross switch supporting simultaneous data traffic in opposing directions
LSI LOGIC CORP0 citations39