Inventor
NOBEKAWA TOMOKO
JP3 patents
Patents
3 patentsUS7765446B2Jul 27, 2010
Method for testing semiconductor integrated circuit and method for verifying design rules
PANASONIC CORP2 citations54
US7543206B2Jun 2, 2009
Method for testing semiconductor integrated circuit and method for verifying design rules
PANASONIC CORP2 citations54
US7498967B2Mar 3, 2009
Semiconductor device
PANASONIC CORP0 citations45